Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation

E. Kh Baksht, S. Ya Belomyttsev, A. G. Burachenko, V. V. Ryzhov, V. F. Tarasenko, Valery Alexandrovich Shklyaev

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The electrical breakdown of a gas-filled diode with a highly nonuniform electric field is studied in the case when a 25-kV voltage pulse generates runaway electron beams with time-separated maxima of different duration behind anode foil. Experimental data are analyzed and numerically simulated using the PIC/MC code OOPIC-Pro. It is shown that, in terms of the model used, both beams arise at the cathode but their formation mechanisms differ. The first runaway electron beam no longer than 500 ps is attributed to the ionization mechanism; the second one, which may last several nanoseconds, is due to emission.

Original languageEnglish
Pages (from-to)998-1002
Number of pages5
JournalTechnical Physics
Volume57
Issue number7
DOIs
Publication statusPublished - Jul 2012
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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