Evolution of structure-phase states of hypoeutectic silumin irradiated by intensive pulse electron beams

Victor Gromov, Sergey Konovalov, Yuriy Ivanov, Dmitrii Zaguliaev, Elizabeth Petrikova, Yuriy Serenkov

Research output: Contribution to journalArticle

Abstract

The methods of modern material physics has been applied to analyse the structural and phase states and the defect substructure of hypoeutectic silumin treated by electron beams with the parameters as follows: energy density - 10-35 J cm-2, pulse duration - 10 μs, number of pulses - 3, pulse-repetition frequency - 0.3. Irradiation of the surface causes melting of the surface layer, formation of a submicron-scale structure of high-speed cellular crystallization and the reprecipitation of particles of the second phase. On distancing from the irradiated surface there were discovered the areas with cells and eutectic lamellae Al-Si separated by layers containing the particles of Cu15Si4, Al4Cu3 the, silicon and copper. There has been made a suggestion about the nature of lamination of the material element composition.

Original languageEnglish
Article number076574
JournalMaterials Research Express
Volume6
Issue number7
DOIs
Publication statusPublished - 17 Apr 2019

Fingerprint

Phase structure
Electron beams
Silicon
Crystallization
Eutectics
Copper
Melting
Physics
Irradiation
Defects
Chemical analysis

Keywords

  • cellular structure
  • high-speed crystallization
  • hypoeutectic silumin
  • treatment by electron beams

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Polymers and Plastics
  • Metals and Alloys

Cite this

Evolution of structure-phase states of hypoeutectic silumin irradiated by intensive pulse electron beams. / Gromov, Victor; Konovalov, Sergey; Ivanov, Yuriy; Zaguliaev, Dmitrii; Petrikova, Elizabeth; Serenkov, Yuriy.

In: Materials Research Express, Vol. 6, No. 7, 076574, 17.04.2019.

Research output: Contribution to journalArticle

Gromov, Victor ; Konovalov, Sergey ; Ivanov, Yuriy ; Zaguliaev, Dmitrii ; Petrikova, Elizabeth ; Serenkov, Yuriy. / Evolution of structure-phase states of hypoeutectic silumin irradiated by intensive pulse electron beams. In: Materials Research Express. 2019 ; Vol. 6, No. 7.
@article{ea758245de314d21964e464c161e0879,
title = "Evolution of structure-phase states of hypoeutectic silumin irradiated by intensive pulse electron beams",
abstract = "The methods of modern material physics has been applied to analyse the structural and phase states and the defect substructure of hypoeutectic silumin treated by electron beams with the parameters as follows: energy density - 10-35 J cm-2, pulse duration - 10 μs, number of pulses - 3, pulse-repetition frequency - 0.3. Irradiation of the surface causes melting of the surface layer, formation of a submicron-scale structure of high-speed cellular crystallization and the reprecipitation of particles of the second phase. On distancing from the irradiated surface there were discovered the areas with cells and eutectic lamellae Al-Si separated by layers containing the particles of Cu15Si4, Al4Cu3 the, silicon and copper. There has been made a suggestion about the nature of lamination of the material element composition.",
keywords = "cellular structure, high-speed crystallization, hypoeutectic silumin, treatment by electron beams",
author = "Victor Gromov and Sergey Konovalov and Yuriy Ivanov and Dmitrii Zaguliaev and Elizabeth Petrikova and Yuriy Serenkov",
year = "2019",
month = "4",
day = "17",
doi = "10.1088/2053-1591/ab1683",
language = "English",
volume = "6",
journal = "Materials Research Express",
issn = "2053-1591",
publisher = "IOP Publishing Ltd.",
number = "7",

}

TY - JOUR

T1 - Evolution of structure-phase states of hypoeutectic silumin irradiated by intensive pulse electron beams

AU - Gromov, Victor

AU - Konovalov, Sergey

AU - Ivanov, Yuriy

AU - Zaguliaev, Dmitrii

AU - Petrikova, Elizabeth

AU - Serenkov, Yuriy

PY - 2019/4/17

Y1 - 2019/4/17

N2 - The methods of modern material physics has been applied to analyse the structural and phase states and the defect substructure of hypoeutectic silumin treated by electron beams with the parameters as follows: energy density - 10-35 J cm-2, pulse duration - 10 μs, number of pulses - 3, pulse-repetition frequency - 0.3. Irradiation of the surface causes melting of the surface layer, formation of a submicron-scale structure of high-speed cellular crystallization and the reprecipitation of particles of the second phase. On distancing from the irradiated surface there were discovered the areas with cells and eutectic lamellae Al-Si separated by layers containing the particles of Cu15Si4, Al4Cu3 the, silicon and copper. There has been made a suggestion about the nature of lamination of the material element composition.

AB - The methods of modern material physics has been applied to analyse the structural and phase states and the defect substructure of hypoeutectic silumin treated by electron beams with the parameters as follows: energy density - 10-35 J cm-2, pulse duration - 10 μs, number of pulses - 3, pulse-repetition frequency - 0.3. Irradiation of the surface causes melting of the surface layer, formation of a submicron-scale structure of high-speed cellular crystallization and the reprecipitation of particles of the second phase. On distancing from the irradiated surface there were discovered the areas with cells and eutectic lamellae Al-Si separated by layers containing the particles of Cu15Si4, Al4Cu3 the, silicon and copper. There has been made a suggestion about the nature of lamination of the material element composition.

KW - cellular structure

KW - high-speed crystallization

KW - hypoeutectic silumin

KW - treatment by electron beams

UR - http://www.scopus.com/inward/record.url?scp=85066066217&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85066066217&partnerID=8YFLogxK

U2 - 10.1088/2053-1591/ab1683

DO - 10.1088/2053-1591/ab1683

M3 - Article

AN - SCOPUS:85066066217

VL - 6

JO - Materials Research Express

JF - Materials Research Express

SN - 2053-1591

IS - 7

M1 - 076574

ER -