Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation

Abstract

The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finite-difference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness.

Original language	English
Title of host publication	Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
Publisher	American Institute of Physics Inc.
Volume	1683
ISBN (Electronic)	9780735413306
DOIs	https://doi.org/10.1063/1.4932708
Publication status	Published - 27 Oct 2015
Event	International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015 - Tomsk, Russian Federation Duration: 21 Sep 2015 → 25 Sep 2015

Conference

Conference	International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015
Country	Russian Federation
City	Tomsk
Period	21.9.15 → 25.9.15

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.4932708

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Balokhonov, RR., Martynov, S. A., Romanova, V. A., & Batukhtina, E. E. (2015). Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Vol. 1683). [020018] American Institute of Physics Inc.. https://doi.org/10.1063/1.4932708

Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation. / Balokhonov, Ruslan Revovich; Martynov, Sergei A.; Romanova, Varvara A.; Batukhtina, Ekaterina E.

Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. Vol. 1683 American Institute of Physics Inc., 2015. 020018.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Balokhonov, RR, Martynov, SA, Romanova, VA & Batukhtina, EE 2015, Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation. in Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. vol. 1683, 020018, American Institute of Physics Inc., International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015, Tomsk, Russian Federation, 21.9.15. https://doi.org/10.1063/1.4932708

@inproceedings{665ad0700948465399b6f16100f7fd48,

title = "Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation",

abstract = "The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finite-difference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness.",

author = "Ruslan Revovich Balokhonov and Martynov, {Sergei A.} and Romanova, {Varvara A.} and Batukhtina, {Ekaterina E.}",

year = "2015",

month = oct,

day = "27",

doi = "10.1063/1.4932708",

language = "English",

volume = "1683",

booktitle = "Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures",

publisher = "American Institute of Physics Inc.",

note = "International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015 ; Conference date: 21-09-2015 Through 25-09-2015",

}

TY - GEN

T1 - Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation

AU - Balokhonov, Ruslan Revovich

AU - Martynov, Sergei A.

AU - Romanova, Varvara A.

AU - Batukhtina, Ekaterina E.

PY - 2015/10/27

Y1 - 2015/10/27

N2 - The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finite-difference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness.

AB - The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finite-difference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness.

UR - http://www.scopus.com/inward/record.url?scp=84984592105&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84984592105&partnerID=8YFLogxK

U2 - 10.1063/1.4932708

DO - 10.1063/1.4932708

M3 - Conference contribution

AN - SCOPUS:84984592105

VL - 1683

BT - Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures

PB - American Institute of Physics Inc.

T2 - International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015

Y2 - 21 September 2015 through 25 September 2015