Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation

Ruslan Revovich Balokhonov, Sergei A. Martynov, Varvara A. Romanova, Ekaterina E. Batukhtina

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The interfacial mechanisms of the stress concentration in materials with modified surface layers are investigated. A dynamic boundary-value problem in a plane-strain formulation is solved numerically by the finite-difference method. Serrated and wavy base material-surface layer interfaces observed experimentally are assigned explicitly in calculations. Two stages in the evolution of the stress concentration are found to occur due to irregular interfacial geometry. The stress concentration in near-interfacial regions turns out to depend on the sinusoidal wavy interface thickness and roughness.

    Original languageEnglish
    Title of host publicationAdvanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
    PublisherAmerican Institute of Physics Inc.
    Volume1683
    ISBN (Electronic)9780735413306
    DOIs
    Publication statusPublished - 27 Oct 2015
    EventInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015 - Tomsk, Russian Federation
    Duration: 21 Sep 201525 Sep 2015

    Conference

    ConferenceInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015
    CountryRussian Federation
    CityTomsk
    Period21.9.1525.9.15

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

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  • Cite this

    Balokhonov, RR., Martynov, S. A., Romanova, V. A., & Batukhtina, E. E. (2015). Evolution of stress concentration along curvilinear modified surface layer-base material interface. Numerical simulation. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Vol. 1683). [020018] American Institute of Physics Inc.. https://doi.org/10.1063/1.4932708