Evaluating quality of marquetries by applying active IR thermography and advanced signal processing

A. O. Chulkov, S. Sfarra, N. Saeed, J. Peeters, C. Ibarra-Castanedo, G. Gargiulo, G. Steenackers, X. P.V. Maldague, M. A. Omar, V. Vavilov

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Physics & Astronomy