Estimation of thermal resistance field in layered materials by analytical asymptotic method

Marie Marthe Groz, Mohamed Bensalem, Alain Sommier, Emmanuelle Abisset-Chavanne, Stéphane Chevalier, Arsenii Chulkov, Jean Luc Battaglia, Jean Christophe Batsale, Christophe Pradere

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

In this paper, the problem of the quantitative characterization of thermal resistance fields in a multilayer sample is addressed by using the classical front face flash method as the thermal excitation and infrared thermography (IRT) as the monitoring sensor. In this challenging problem, the complete inverse processing of a multilayer analytical model is difficult due to the lack of sensitivity of some parameters (layer thickness, depth of thermal resistance, etc.) and the expansive computational iterative processing. For these reasons, the proposed strategy is to use a simple multilayer problem where only one resistive layer is estimated. Moreover, to simplify the inverse processing often based on iterative methods, an asymptotic development method is proposed here. Regarding the thermal signal reconstruction (TSR) methods, the drawback of these methods is the inability to be quantitative. To overcome this problem, the method incorporates a calibration process originating from the complete analytical quadrupole solution to the thermal problem. This analytical knowledge allows self-calibration of the asymptotic method. From this calibration, the quantitative thermal resistance field of a sample can be retrieved with a reasonable accuracy lower than 5%.

Original languageEnglish
Article number2351
JournalApplied Sciences (Switzerland)
Volume10
Issue number7
DOIs
Publication statusPublished - 1 Apr 2020

Keywords

  • Inverse processing
  • Thermal resistance estimation IR thermography

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Engineering(all)
  • Process Chemistry and Technology
  • Computer Science Applications
  • Fluid Flow and Transfer Processes

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  • Cite this

    Groz, M. M., Bensalem, M., Sommier, A., Abisset-Chavanne, E., Chevalier, S., Chulkov, A., Battaglia, J. L., Batsale, J. C., & Pradere, C. (2020). Estimation of thermal resistance field in layered materials by analytical asymptotic method. Applied Sciences (Switzerland), 10(7), [2351]. https://doi.org/10.3390/app10072351