Electron microscopy studies of near-surface layers of ZrO2(Y)-Al2O3 composite ceramic modified by high-current beam of low-energy electrons

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Abstract

The influence of a high-current pulsed beam of low-energy electrons (HCBLE) on the structural state of near-surface layers of ZrO2(Y)-Al2O3 composite ceramic with various levels of porosity is studied using scanning electron microscopy (SEM). It is demonstrated that the electron processing leads to melting and subsequent crystallization of the ceramic near-surface layer with thickness of 30–40 μm. The surface microstructure and cross section of electron-beam-modified layers of ceramic specimens are analyzed using SEM. It is revealed that, in the irradiated near-surface layer of all considered ceramic types, there are actually no pores and grains of the corundum phase. It is found that electron beam irradiation leads to a decrease in grain size and formation of texture in the near-surface layers.

Original languageEnglish
Pages (from-to)536-539
Number of pages4
JournalInorganic Materials: Applied Research
Volume5
Issue number5
DOIs
Publication statusPublished - 24 Oct 2014

Keywords

  • composite ceramics
  • electron beams
  • microstructure
  • zirconium dioxide

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

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