TY - JOUR
T1 - Electron beam deflection with channeling in a silicon crystal at the REFER electron ring
AU - Strokov, S.
AU - Takahashi, T.
AU - Endo, I.
AU - Iinuma, M.
AU - Ueda, K.
AU - Kuroiwa, H.
AU - Ohnishi, T.
AU - Sawada, Seiji
PY - 2006/11
Y1 - 2006/11
N2 - A new result on the deflection of 150 MeV electron beams with using the 〈1 0 0〉 axis of a silicon crystal is presented. The channeling effect of electrons passed through the crystal was clearly seen. We also studied dependence of the deflection on the beam divergence. The simulation qualitatively agreed with the experimental data.
AB - A new result on the deflection of 150 MeV electron beams with using the 〈1 0 0〉 axis of a silicon crystal is presented. The channeling effect of electrons passed through the crystal was clearly seen. We also studied dependence of the deflection on the beam divergence. The simulation qualitatively agreed with the experimental data.
KW - Channeling
KW - Electron beam deflection
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U2 - 10.1016/j.nimb.2006.07.011
DO - 10.1016/j.nimb.2006.07.011
M3 - Article
AN - SCOPUS:33750428589
VL - 252
SP - 16
EP - 19
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
IS - 1
ER -