Electron beam deflection with channeling in a silicon crystal at the REFER electron ring

S. Strokov, T. Takahashi, I. Endo, M. Iinuma, K. Ueda, H. Kuroiwa, T. Ohnishi, Seiji Sawada

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

A new result on the deflection of 150 MeV electron beams with using the 〈1 0 0〉 axis of a silicon crystal is presented. The channeling effect of electrons passed through the crystal was clearly seen. We also studied dependence of the deflection on the beam divergence. The simulation qualitatively agreed with the experimental data.

Original languageEnglish
Pages (from-to)16-19
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume252
Issue number1
DOIs
Publication statusPublished - Nov 2006
Externally publishedYes

Keywords

  • Channeling
  • Electron beam deflection

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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