Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces

Konstantin Arefyev, Vladimir Salnikov, Evguenya Lukyanova

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

Original languageEnglish
Title of host publication8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004
Pages188-190
Number of pages3
Volume2
Publication statusPublished - 2004
Event8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 - Tomsk, Russian Federation
Duration: 26 Jun 2004 → 3 Jul 2004

Other

Other8th Korea-Russia International Symposium on Science and Technology, KORUS 2004
CountryRussian Federation
CityTomsk
Period26.6.04 → 3.7.04

Fingerprint

Surface treatment
Silicon
Hot Temperature

Keywords

  • Electromagnetic emission
  • Intensity of electromagnetic emission
  • Phase transmission
  • Positron-annihilation
  • Silicon

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Arefyev, K., Salnikov, V., & Lukyanova, E. (2004). Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. In 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004 (Vol. 2, pp. 188-190)

Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. / Arefyev, Konstantin; Salnikov, Vladimir; Lukyanova, Evguenya.

8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Vol. 2 2004. p. 188-190.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Arefyev, K, Salnikov, V & Lukyanova, E 2004, Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. in 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. vol. 2, pp. 188-190, 8th Korea-Russia International Symposium on Science and Technology, KORUS 2004, Tomsk, Russian Federation, 26.6.04.
Arefyev K, Salnikov V, Lukyanova E. Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. In 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Vol. 2. 2004. p. 188-190
Arefyev, Konstantin ; Salnikov, Vladimir ; Lukyanova, Evguenya. / Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Vol. 2 2004. pp. 188-190
@inproceedings{1b0750a1e7884af9bd6f00350358f4aa,
title = "Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces",
abstract = "Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.",
keywords = "Electromagnetic emission, Intensity of electromagnetic emission, Phase transmission, Positron-annihilation, Silicon",
author = "Konstantin Arefyev and Vladimir Salnikov and Evguenya Lukyanova",
year = "2004",
language = "English",
isbn = "0780383834",
volume = "2",
pages = "188--190",
booktitle = "8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004",

}

TY - GEN

T1 - Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces

AU - Arefyev, Konstantin

AU - Salnikov, Vladimir

AU - Lukyanova, Evguenya

PY - 2004

Y1 - 2004

N2 - Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

AB - Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

KW - Electromagnetic emission

KW - Intensity of electromagnetic emission

KW - Phase transmission

KW - Positron-annihilation

KW - Silicon

UR - http://www.scopus.com/inward/record.url?scp=29144469504&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=29144469504&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:29144469504

SN - 0780383834

SN - 9780780383838

VL - 2

SP - 188

EP - 190

BT - 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004

ER -

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