Abstract
Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.
| Original language | English |
|---|---|
| Title of host publication | 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004 |
| Pages | 188-190 |
| Number of pages | 3 |
| Volume | 2 |
| Publication status | Published - 2004 |
| Event | 8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 - Tomsk, Russian Federation Duration: 26 Jun 2004 → 3 Jul 2004 |
Other
| Other | 8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 |
|---|---|
| Country | Russian Federation |
| City | Tomsk |
| Period | 26.6.04 → 3.7.04 |
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Keywords
- Electromagnetic emission
- Intensity of electromagnetic emission
- Phase transmission
- Positron-annihilation
- Silicon
ASJC Scopus subject areas
- Engineering(all)
Cite this
Arefyev, K., Salnikov, V., & Lukyanova, E. (2004). Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. In 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004 (Vol. 2, pp. 188-190)