Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces

Abstract

Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

Original language	English
Title of host publication	8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004
Pages	188-190
Number of pages	3
Volume	2
Publication status	Published - 2004
Event	8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 - Tomsk, Russian Federation Duration: 26 Jun 2004 → 3 Jul 2004

Other

Other	8th Korea-Russia International Symposium on Science and Technology, KORUS 2004
Country	Russian Federation
City	Tomsk
Period	26.6.04 → 3.7.04

Keywords

Electromagnetic emission
Intensity of electromagnetic emission
Phase transmission
Positron-annihilation
Silicon

ASJC Scopus subject areas

Engineering(all)

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Cite this

Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. / Arefyev, Konstantin; Salnikov, Vladimir; Lukyanova, Evguenya.

8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. Vol. 2 2004. p. 188-190.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Arefyev, K, Salnikov, V & Lukyanova, E 2004, Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. in 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004. vol. 2, pp. 188-190, 8th Korea-Russia International Symposium on Science and Technology, KORUS 2004, Tomsk, Russian Federation, 26.6.04.

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title = "Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces",

abstract = "Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.",

keywords = "Electromagnetic emission, Intensity of electromagnetic emission, Phase transmission, Positron-annihilation, Silicon",

author = "Konstantin Arefyev and Vladimir Salnikov and Evguenya Lukyanova",

year = "2004",

language = "English",

isbn = "0780383834",

volume = "2",

pages = "188--190",

booktitle = "8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004",

note = "8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 ; Conference date: 26-06-2004 Through 03-07-2004",

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T1 - Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces

AU - Arefyev, Konstantin

AU - Salnikov, Vladimir

AU - Lukyanova, Evguenya

PY - 2004

Y1 - 2004

N2 - Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

AB - Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

KW - Electromagnetic emission

KW - Intensity of electromagnetic emission

KW - Phase transmission

KW - Positron-annihilation

KW - Silicon

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M3 - Conference contribution

AN - SCOPUS:29144469504

SN - 0780383834

SN - 9780780383838

VL - 2

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EP - 190

BT - 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004

T2 - 8th Korea-Russia International Symposium on Science and Technology, KORUS 2004

Y2 - 26 June 2004 through 3 July 2004

ER -