Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces

Konstantin Arefyev, Vladimir Salnikov, Evguenya Lukyanova

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Results on measurement of impulse electromagnetic emission of the silicon samples with different surface treatment are presented in this paper.

Original languageEnglish
Title of host publication8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004
Pages188-190
Number of pages3
Volume2
Publication statusPublished - 2004
Event8th Korea-Russia International Symposium on Science and Technology, KORUS 2004 - Tomsk, Russian Federation
Duration: 26 Jun 20043 Jul 2004

Other

Other8th Korea-Russia International Symposium on Science and Technology, KORUS 2004
CountryRussian Federation
CityTomsk
Period26.6.043.7.04

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Keywords

  • Electromagnetic emission
  • Intensity of electromagnetic emission
  • Phase transmission
  • Positron-annihilation
  • Silicon

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Arefyev, K., Salnikov, V., & Lukyanova, E. (2004). Electromagnetic emission within the heat field of the silicon samples with diferently polished surfaces. In 8th Korea-Russia International Symposium on Science and Technology - Proceedings: KORUS 2004 (Vol. 2, pp. 188-190)