Elasticity of the Sm1-xYxS alloy Based on Ultrasonic Measurements

Abstract

The elastic moduli, sound velocities, Gruneisen parameter, Poisson's ratios and brittleness-plasticity criterion ratios are studied for the Sm_1-xY_xS alloys. Their dependence on the concentration of alloy components including a valence transition from semiconductors into the metal phase is presented. Auxeticity (negative Poisson's ratio) is found for some concentrations.

Original language	English
Article number	012029
Journal	IOP Conference Series: Materials Science and Engineering
Volume	142
Issue number	1
DOIs	https://doi.org/10.1088/1757-899X/142/1/012029
Publication status	Published - 2 Sep 2016
Event	7th International Scientific Practical Conference on Innovative Technologies in Engineering - Yurga, Russian Federation Duration: 19 May 2016 → 21 May 2016

ASJC Scopus subject areas

Materials Science(all)
Engineering(all)

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10.1088/1757-899X/142/1/012029

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Soboleva, E. G., Igisheva, A. L., & Wojciechowski, K. W. (2016). Elasticity of the Sm_1-xY_xS alloy Based on Ultrasonic Measurements. IOP Conference Series: Materials Science and Engineering, 142(1), [012029]. https://doi.org/10.1088/1757-899X/142/1/012029

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abstract = "The elastic moduli, sound velocities, Gruneisen parameter, Poisson's ratios and brittleness-plasticity criterion ratios are studied for the Sm1-xYxS alloys. Their dependence on the concentration of alloy components including a valence transition from semiconductors into the metal phase is presented. Auxeticity (negative Poisson's ratio) is found for some concentrations.",

author = "Soboleva, {E. G.} and Igisheva, {A. L.} and Wojciechowski, {K. W.}",

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AB - The elastic moduli, sound velocities, Gruneisen parameter, Poisson's ratios and brittleness-plasticity criterion ratios are studied for the Sm1-xYxS alloys. Their dependence on the concentration of alloy components including a valence transition from semiconductors into the metal phase is presented. Auxeticity (negative Poisson's ratio) is found for some concentrations.

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