Abstract
The spectra of X-ray diffraction from the reflecting atomic plane (1 0 1̅ 1) of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250°C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6° and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam.
| Original language | English |
|---|---|
| Pages (from-to) | 1109-1112 |
| Number of pages | 4 |
| Journal | Journal of Surface Investigation |
| Volume | 11 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1 Nov 2017 |
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Keywords
- crystal
- quartz
- temperature gradient
- X-ray radiation
ASJC Scopus subject areas
- Surfaces, Coatings and Films
Cite this
Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal. / Mkrtchyan, A. R.; Potylitsyn, A. P.; Vukolov, A. V.; Novokshonov, A. I.; Gogolev, A. S.; Amiragyan, R. V.; Movsisyan, A. E.
In: Journal of Surface Investigation, Vol. 11, No. 6, 01.11.2017, p. 1109-1112.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal
AU - Mkrtchyan, A. R.
AU - Potylitsyn, A. P.
AU - Vukolov, A. V.
AU - Novokshonov, A. I.
AU - Gogolev, A. S.
AU - Amiragyan, R. V.
AU - Movsisyan, A. E.
PY - 2017/11/1
Y1 - 2017/11/1
N2 - The spectra of X-ray diffraction from the reflecting atomic plane (1 0 1̅ 1) of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250°C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6° and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam.
AB - The spectra of X-ray diffraction from the reflecting atomic plane (1 0 1̅ 1) of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250°C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6° and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam.
KW - crystal
KW - quartz
KW - temperature gradient
KW - X-ray radiation
UR - http://www.scopus.com/inward/record.url?scp=85042649984&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85042649984&partnerID=8YFLogxK
U2 - 10.1134/S1027451017050111
DO - 10.1134/S1027451017050111
M3 - Article
AN - SCOPUS:85042649984
VL - 11
SP - 1109
EP - 1112
JO - Journal of Surface Investigation
JF - Journal of Surface Investigation
SN - 1027-4510
IS - 6
ER -