Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal

A. R. Mkrtchyan, A. P. Potylitsyn, A. V. Vukolov, A. I. Novokshonov, A. S. Gogolev, R. V. Amiragyan, A. E. Movsisyan

Research output: Contribution to journalArticle

Abstract

The spectra of X-ray diffraction from the reflecting atomic plane (1 0 1̅ 1) of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250°C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6° and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam.

Original languageEnglish
Pages (from-to)1109-1112
Number of pages4
JournalJournal of Surface Investigation
Volume11
Issue number6
DOIs
Publication statusPublished - 1 Nov 2017

Fingerprint

Quartz
Thermal gradients
X ray diffraction
Crystals
Spectrometers
Geometry
Single crystals
Heating
Temperature

Keywords

  • crystal
  • quartz
  • temperature gradient
  • X-ray radiation

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

Cite this

Effect of the Temperature Gradient on the X-ray Diffraction Spectrum of a Quartz Crystal. / Mkrtchyan, A. R.; Potylitsyn, A. P.; Vukolov, A. V.; Novokshonov, A. I.; Gogolev, A. S.; Amiragyan, R. V.; Movsisyan, A. E.

In: Journal of Surface Investigation, Vol. 11, No. 6, 01.11.2017, p. 1109-1112.

Research output: Contribution to journalArticle

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AB - The spectra of X-ray diffraction from the reflecting atomic plane (1 0 1̅ 1) of a quartz single crystal are studied in Laue geometry under the action of temperature gradient on a BDER-KI-11K spectrometer with a resolution of 300 eV on the Am241 line of 17.74 keV. The temperature gradient leads to an increase in the intensity of the diffracted beam depending on the heating temperature. It is shown that the intensity of X-ray diffraction in Laue geometry may increase at a temperature gradient of 250°C/cm by two orders of magnitude in comparison with the uniform temperature state of the crystal. The rocking curve of the reflected beam is obtained at a fixed observation angle of 6° and a specified temperature gradient. It is demonstrated that the intensity of the reflected beam increases with increasing temperature gradient (to a certain value), while the spectral width of the reflection line remains constant and is governed by the energy resolution of the spectrometer. A further growth in the temperature gradient leads to an increase in the spectral width of the reflection line with decreasing intensity of the reflected beam.

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