Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

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It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

Original languageEnglish
Pages (from-to)290-296
Number of pages7
JournalJournal of Surface Investigation
Issue number2
Publication statusPublished - Apr 2008


ASJC Scopus subject areas

  • Surfaces, Coatings and Films

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