Abstract
It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.
| Original language | English |
|---|---|
| Pages (from-to) | 290-296 |
| Number of pages | 7 |
| Journal | Journal of Surface Investigation |
| Volume | 2 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Apr 2008 |
Fingerprint
ASJC Scopus subject areas
- Surfaces, Coatings and Films
Cite this
Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon. / Bogdanov, O. V.; Korotchenko, K. B.; Pivovarov, Yu L.
In: Journal of Surface Investigation, Vol. 2, No. 2, 04.2008, p. 290-296.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon
AU - Bogdanov, O. V.
AU - Korotchenko, K. B.
AU - Pivovarov, Yu L.
PY - 2008/4
Y1 - 2008/4
N2 - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.
AB - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.
UR - http://www.scopus.com/inward/record.url?scp=58449123567&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=58449123567&partnerID=8YFLogxK
U2 - 10.1134/S1027451008020249
DO - 10.1134/S1027451008020249
M3 - Article
VL - 2
SP - 290
EP - 296
JO - Journal of Surface Investigation
JF - Journal of Surface Investigation
SN - 1027-4510
IS - 2
ER -