Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

Abstract

It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

Original language	English
Pages (from-to)	290-296
Number of pages	7
Journal	Journal of Surface Investigation
Volume	2
Issue number	2
DOIs	https://doi.org/10.1134/S1027451008020249
Publication status	Published - Apr 2008

ASJC Scopus subject areas

Surfaces, Coatings and Films

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10.1134/S1027451008020249

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title = "Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon",

abstract = "It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.",

author = "Bogdanov, {O. V.} and Korotchenko, {K. B.} and Pivovarov, {Yu L.}",

year = "2008",

month = apr,

doi = "10.1134/S1027451008020249",

language = "English",

volume = "2",

pages = "290--296",

journal = "Journal of Surface Investigation",

issn = "1027-4510",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "2",

}

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AU - Bogdanov, O. V.

AU - Korotchenko, K. B.

AU - Pivovarov, Yu L.

PY - 2008/4

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N2 - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

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JO - Journal of Surface Investigation

JF - Journal of Surface Investigation

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