Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

Abstract

It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

Original language	English
Pages (from-to)	290-296
Number of pages	7
Journal	Journal of Surface Investigation
Volume	2
Issue number	2
DOIs	https://doi.org/10.1134/S1027451008020249
Publication status	Published - Apr 2008

ASJC Scopus subject areas

Surfaces, Coatings and Films

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10.1134/S1027451008020249

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@article{7fabef7b60df4642a9c0c273350900ba,

title = "Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon",

abstract = "It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.",

author = "Bogdanov, {O. V.} and Korotchenko, {K. B.} and Pivovarov, {Yu L.}",

year = "2008",

month = apr,

doi = "10.1134/S1027451008020249",

language = "English",

volume = "2",

pages = "290--296",

journal = "Journal of Surface Investigation",

issn = "1027-4510",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "2",

}

TY - JOUR

T1 - Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

AU - Bogdanov, O. V.

AU - Korotchenko, K. B.

AU - Pivovarov, Yu L.

PY - 2008/4

Y1 - 2008/4

N2 - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

AB - It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.

UR - http://www.scopus.com/inward/record.url?scp=58449123567&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=58449123567&partnerID=8YFLogxK

U2 - 10.1134/S1027451008020249

DO - 10.1134/S1027451008020249

M3 - Article

AN - SCOPUS:58449123567

VL - 2

SP - 290

EP - 296

JO - Journal of Surface Investigation

JF - Journal of Surface Investigation

SN - 1027-4510

IS - 2

ER -

Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon

Abstract

ASJC Scopus subject areas

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