Abstract
It is shown that the inclusion of the band structure of energy levels of channeled positrons (as in the case of electrons) leads to a qualitative change in the angular distribution of X-ray radiation.
| Original language | English |
|---|---|
| Pages (from-to) | 290-296 |
| Number of pages | 7 |
| Journal | Journal of Surface Investigation |
| Volume | 2 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Apr 2008 |
ASJC Scopus subject areas
- Surfaces, Coatings and Films
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Bogdanov, O. V., Korotchenko, K. B., & Pivovarov, Y. L. (2008). Effect of the band structure of energy levels on the angular distribution of diffracted X-ray radiation for positron plane channeling in silicon. Journal of Surface Investigation, 2(2), 290-296. https://doi.org/10.1134/S1027451008020249