Abstract
The effect of the pulse nanosecond volume discharge in air at atmospheric pressure on the admittance of MIS structures based on MBE graded-gap p-Hg0.78Cd0.22Te is studied in a wide range of frequencies and temperatures. It is shown that the impact of the discharge leads to significant changes in electrical characteristics of MIS structures (the density ofpositive fixed charge increases), to the changes in the nature of the hysteresis of capacitance-voltage characteristics, and to an increase in the density of surface states. A possible reason for the changes in the characteristics of MIS structures after exposure to the discharge is substantial restructuring of the defect-impurity system of the semiconductor near the interface.
| Original language | English |
|---|---|
| Pages (from-to) | 970-977 |
| Number of pages | 8 |
| Journal | Russian Physics Journal |
| Volume | 58 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Nov 2015 |
| Externally published | Yes |
Keywords
- Admittance
- Fixed charge
- HgCdTe
- MIS structure
- Molecular beam epitaxy
- Pulsed nanosecond volume discharge
ASJC Scopus subject areas
- Physics and Astronomy(all)
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Voitsekhovskii, A. V., Nesmelov, S. N., Dzyadukh, S. M., Grigor’ev, D. V., Tarasenko, V. F., & Shulepov, M. A. (2015). Effect of pulse nanosecond volume discharge in air at atmospheric pressure on electrical properties of MIS structures based on p-HgCdTe grown by molecular beam epitaxy. Russian Physics Journal, 58(7), 970-977. https://doi.org/10.1007/s11182-015-0597-3