Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep

S. V. Konovalov, O. A. Stolboushkina, Y. F. Ivanov, R. A. Filipiev, V. E. Gromov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The dislocation substructure evolution on A1 creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the A1 sample surface is accompanied by the increase of dislocation substructure self-organization degree.

Original languageEnglish
Title of host publicationTMS Annual Meeting
Pages151-156
Number of pages6
Volume1
Publication statusPublished - 2010
EventTMS 2010 - 139th Annual Meeting and Exhibition - Seattle, WA, United States
Duration: 14 Feb 201018 Feb 2010

Other

OtherTMS 2010 - 139th Annual Meeting and Exhibition
CountryUnited States
CitySeattle, WA
Period14.2.1018.2.10

Fingerprint

substructures
Aluminum
Electron microscopy
Creep
Diffraction
aluminum
Defects
defects
Electric potential
electric potential
electron microscopy
diffraction

Keywords

  • Aluminum
  • Dislocations
  • Electron microscopy
  • Fracture

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Mechanics of Materials
  • Metals and Alloys

Cite this

Konovalov, S. V., Stolboushkina, O. A., Ivanov, Y. F., Filipiev, R. A., & Gromov, V. E. (2010). Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep. In TMS Annual Meeting (Vol. 1, pp. 151-156)

Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep. / Konovalov, S. V.; Stolboushkina, O. A.; Ivanov, Y. F.; Filipiev, R. A.; Gromov, V. E.

TMS Annual Meeting. Vol. 1 2010. p. 151-156.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Konovalov, SV, Stolboushkina, OA, Ivanov, YF, Filipiev, RA & Gromov, VE 2010, Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep. in TMS Annual Meeting. vol. 1, pp. 151-156, TMS 2010 - 139th Annual Meeting and Exhibition, Seattle, WA, United States, 14.2.10.
Konovalov SV, Stolboushkina OA, Ivanov YF, Filipiev RA, Gromov VE. Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep. In TMS Annual Meeting. Vol. 1. 2010. p. 151-156
Konovalov, S. V. ; Stolboushkina, O. A. ; Ivanov, Y. F. ; Filipiev, R. A. ; Gromov, V. E. / Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep. TMS Annual Meeting. Vol. 1 2010. pp. 151-156
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