Abstract
The dislocation substructure evolution on A1 creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the A1 sample surface is accompanied by the increase of dislocation substructure self-organization degree.
| Original language | English |
|---|---|
| Title of host publication | TMS Annual Meeting |
| Pages | 151-156 |
| Number of pages | 6 |
| Volume | 1 |
| Publication status | Published - 2010 |
| Event | TMS 2010 - 139th Annual Meeting and Exhibition - Seattle, WA, United States Duration: 14 Feb 2010 → 18 Feb 2010 |
Other
| Other | TMS 2010 - 139th Annual Meeting and Exhibition |
|---|---|
| Country | United States |
| City | Seattle, WA |
| Period | 14.2.10 → 18.2.10 |
Keywords
- Aluminum
- Dislocations
- Electron microscopy
- Fracture
ASJC Scopus subject areas
- Condensed Matter Physics
- Mechanics of Materials
- Metals and Alloys
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Konovalov, S. V., Stolboushkina, O. A., Ivanov, Y. F., Filipiev, R. A., & Gromov, V. E. (2010). Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep. In TMS Annual Meeting (Vol. 1, pp. 151-156)