Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep

S. V. Konovalov, O. A. Stolboushkina, Y. F. Ivanov, R. A. Filipiev, V. E. Gromov

Research Center for Physical Materials Science and Composite Materials

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The dislocation substructure evolution on A1 creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the A1 sample surface is accompanied by the increase of dislocation substructure self-organization degree.

Original language	English
Title of host publication	TMS Annual Meeting
Pages	151-156
Number of pages	6
Volume	1
Publication status	Published - 2010
Event	TMS 2010 - 139th Annual Meeting and Exhibition - Seattle, WA, United States Duration: 14 Feb 2010 → 18 Feb 2010

Other

Other	TMS 2010 - 139th Annual Meeting and Exhibition
Country	United States
City	Seattle, WA
Period	14.2.10 → 18.2.10

Keywords

Aluminum
Dislocations
Electron microscopy
Fracture

ASJC Scopus subject areas

Condensed Matter Physics
Mechanics of Materials
Metals and Alloys

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title = "Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep",

abstract = "The dislocation substructure evolution on A1 creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the A1 sample surface is accompanied by the increase of dislocation substructure self-organization degree.",

keywords = "Aluminum, Dislocations, Electron microscopy, Fracture",

author = "Konovalov, {S. V.} and Stolboushkina, {O. A.} and Ivanov, {Y. F.} and Filipiev, {R. A.} and Gromov, {V. E.}",

year = "2010",

language = "English",

isbn = "9780873397513",

volume = "1",

pages = "151--156",

booktitle = "TMS Annual Meeting",

note = "TMS 2010 - 139th Annual Meeting and Exhibition ; Conference date: 14-02-2010 Through 18-02-2010",

}

TY - GEN

T1 - Effect of electric potential on the evolution of defect substructure and fracture surface of aluminum under creep

AU - Konovalov, S. V.

AU - Stolboushkina, O. A.

AU - Ivanov, Y. F.

AU - Filipiev, R. A.

AU - Gromov, V. E.

PY - 2010

Y1 - 2010

N2 - The dislocation substructure evolution on A1 creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the A1 sample surface is accompanied by the increase of dislocation substructure self-organization degree.

AB - The dislocation substructure evolution on A1 creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the A1 sample surface is accompanied by the increase of dislocation substructure self-organization degree.

KW - Aluminum

KW - Dislocations

KW - Electron microscopy

KW - Fracture

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M3 - Conference contribution

AN - SCOPUS:77952355174

SN - 9780873397513

VL - 1

SP - 151

EP - 156

BT - TMS Annual Meeting

T2 - TMS 2010 - 139th Annual Meeting and Exhibition

Y2 - 14 February 2010 through 18 February 2010

ER -