Abstract
The influence of adaptive bilateral filtration on the calculation of the fractal dimension of optical images is estimated. Filtration parameters are chosen on the basis of various criteria. The use of the maximum dispersion of the probability as the most effective parameter of estimating the image filtration quality is considered.
| Original language | English |
|---|---|
| Pages (from-to) | 234-242 |
| Number of pages | 9 |
| Journal | Optoelectronics, Instrumentation and Data Processing |
| Volume | 49 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Aug 2013 |
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Keywords
- filtration
- fractal dimension
- noise estimate
ASJC Scopus subject areas
- Instrumentation
- Condensed Matter Physics
- Electrical and Electronic Engineering
Cite this
Effect of bilateral filtration on fractal estimation of optical images of loaded material surfaces. / Panin, S. V.; Altukhov, Yu A.; Lyubutin, P. S.; Byakov, A. V.; Khizhnyak, S. A.
In: Optoelectronics, Instrumentation and Data Processing, Vol. 49, No. 3, 01.08.2013, p. 234-242.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Effect of bilateral filtration on fractal estimation of optical images of loaded material surfaces
AU - Panin, S. V.
AU - Altukhov, Yu A.
AU - Lyubutin, P. S.
AU - Byakov, A. V.
AU - Khizhnyak, S. A.
PY - 2013/8/1
Y1 - 2013/8/1
N2 - The influence of adaptive bilateral filtration on the calculation of the fractal dimension of optical images is estimated. Filtration parameters are chosen on the basis of various criteria. The use of the maximum dispersion of the probability as the most effective parameter of estimating the image filtration quality is considered.
AB - The influence of adaptive bilateral filtration on the calculation of the fractal dimension of optical images is estimated. Filtration parameters are chosen on the basis of various criteria. The use of the maximum dispersion of the probability as the most effective parameter of estimating the image filtration quality is considered.
KW - filtration
KW - fractal dimension
KW - noise estimate
UR - http://www.scopus.com/inward/record.url?scp=84880704649&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84880704649&partnerID=8YFLogxK
U2 - 10.3103/S8756699013030047
DO - 10.3103/S8756699013030047
M3 - Article
AN - SCOPUS:84880704649
VL - 49
SP - 234
EP - 242
JO - Optoelectronics, Instrumentation and Data Processing
JF - Optoelectronics, Instrumentation and Data Processing
SN - 8756-6990
IS - 3
ER -