Abstract
Dispersion of refractive index and extinction coefficient of nickel film and nickel crystal surface (100) has been determined with spectroscopic ellipsometry over spectral range λ ∼ 250-1030 nm. Nickel film has been prepared by thermal evaporation method. Nickel crystal has been grown by horizontal Bridgman method. The crystal surface (100) at a first stage was mechanically polished and then treated by electro-polishing to remove the damage layer.
Original language | English |
---|---|
Title of host publication | 2010 11th Annual International Conference and Seminar on Micro/Nanotechnologies and Electron Devices, EDM'2010 - Proceedings |
Pages | 37-39 |
Number of pages | 3 |
DOIs | |
Publication status | Published - 2010 |
Event | 2010 11th Annual International Conference and Seminar on Micro/Nanotechnologies and Electron Devices, EDM'2010 - Altai, Russian Federation Duration: 30 Jun 2010 → 4 Jul 2010 |
Other
Other | 2010 11th Annual International Conference and Seminar on Micro/Nanotechnologies and Electron Devices, EDM'2010 |
---|---|
Country | Russian Federation |
City | Altai |
Period | 30.6.10 → 4.7.10 |
Keywords
- Extinction coefficient
- Nickel
- Refractive index
- Spectroscopic ellipsometry
- Surface structure
ASJC Scopus subject areas
- Electrical and Electronic Engineering