Dispersion of electrical characteristics and short-circuit robustness of 600V E-mode GaN transistors

Matthieu Landel, Stéphane Lefebvre, Denis Labrousse, Cyrille Gautier, Fadi Zaki, Zoubir Khatir

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

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Mathematics

Engineering & Materials Science