Dislocation substructure evolution on Al creep under the action of the weak electric potential

V. E. Gromov, Yu F. Ivanov, O. A. Stolboushkina, S. V. Konovalov

Research Center for Physical Materials Science and Composite Materials

Research output: Contribution to journal › Article › peer-review

Abstract

The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.

Original language	English
Pages (from-to)	858-861
Number of pages	4
Journal	Materials Science and Engineering A
Volume	527
Issue number	3
DOIs	https://doi.org/10.1016/j.msea.2009.10.045
Publication status	Published - 15 Jan 2010

Keywords

Aluminum
Dislocations
Electron microscopy
Fracture

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanical Engineering
Mechanics of Materials

Access to Document

10.1016/j.msea.2009.10.045

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title = "Dislocation substructure evolution on Al creep under the action of the weak electric potential",

abstract = "The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.",

keywords = "Aluminum, Dislocations, Electron microscopy, Fracture",

author = "Gromov, {V. E.} and Ivanov, {Yu F.} and Stolboushkina, {O. A.} and Konovalov, {S. V.}",

year = "2010",

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language = "English",

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AU - Gromov, V. E.

AU - Ivanov, Yu F.

AU - Stolboushkina, O. A.

AU - Konovalov, S. V.

PY - 2010/1/15

Y1 - 2010/1/15

N2 - The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.

AB - The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.

KW - Aluminum

KW - Dislocations

KW - Electron microscopy

KW - Fracture

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