Dislocation substructure evolution on Al creep under the action of the weak electric potential

V. E. Gromov, Yu F. Ivanov, O. A. Stolboushkina, S. V. Konovalov

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.

Original languageEnglish
Pages (from-to)858-861
Number of pages4
JournalMaterials Science and Engineering A
Volume527
Issue number3
DOIs
Publication statusPublished - 15 Jan 2010

Fingerprint

substructures
Electron microscopy
Creep
Diffraction
Electric potential
electric potential
electron microscopy
diffraction

Keywords

  • Aluminum
  • Dislocations
  • Electron microscopy
  • Fracture

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Dislocation substructure evolution on Al creep under the action of the weak electric potential. / Gromov, V. E.; Ivanov, Yu F.; Stolboushkina, O. A.; Konovalov, S. V.

In: Materials Science and Engineering A, Vol. 527, No. 3, 15.01.2010, p. 858-861.

Research output: Contribution to journalArticle

Gromov, V. E. ; Ivanov, Yu F. ; Stolboushkina, O. A. ; Konovalov, S. V. / Dislocation substructure evolution on Al creep under the action of the weak electric potential. In: Materials Science and Engineering A. 2010 ; Vol. 527, No. 3. pp. 858-861.
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