Abstract
The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.
| Original language | English |
|---|---|
| Pages (from-to) | 858-861 |
| Number of pages | 4 |
| Journal | Materials Science and Engineering A |
| Volume | 527 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 15 Jan 2010 |
Keywords
- Aluminum
- Dislocations
- Electron microscopy
- Fracture
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanical Engineering
- Mechanics of Materials
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Gromov, V. E., Ivanov, Y. F., Stolboushkina, O. A., & Konovalov, S. V. (2010). Dislocation substructure evolution on Al creep under the action of the weak electric potential. Materials Science and Engineering A, 527(3), 858-861. https://doi.org/10.1016/j.msea.2009.10.045