The results of transmission electron microscopic studies of dislocation structure formed in Ti and Zr ion implanted coarse-grain copper are presented. The long-range effect depends sufficiently on phase formation in the alloying layer. The layer microstructure changes in depth are in correlation with the sample microhardness.
|Number of pages||7|
|Journal||Fizika i Khimiya Obrabotki Materialov|
|Publication status||Published - Jul 1996|
ASJC Scopus subject areas
- Materials Science(all)