Abstract
Two digital devices were developed to enhance the possibilities of high speed thermovisers in thermal nondestructive testing: digital thermograms processor with a memory DTPM-1,2 and microprocessor unit MPT-1. These units could be used either in a single variant or together with a personal computer to increase the reliability of inner defects detection in solids against the specific noise.Principles of thermal tomography are discussed.
Original language | English |
---|---|
Pages (from-to) | 642-645 |
Number of pages | 4 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 1032 |
DOIs | |
Publication status | Published - 7 Jun 1989 |
Event | 18th International Congress on High Speed Photography and Photonics 1988 - Xi'an, China Duration: 28 Aug 1988 → 2 Sep 1988 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering