Digital devices for industrial opto-mechanical high speed thermoviser and its applications in industry and medicine

Abstract

Two digital devices were developed to enhance the possibilities of high speed thermovisers in thermal nondestructive testing: digital thermograms processor with a memory DTPM-1,2 and microprocessor unit MPT-1. These units could be used either in a single variant or together with a personal computer to increase the reliability of inner defects detection in solids against the specific noise.Principles of thermal tomography are discussed.

Original language	English
Pages (from-to)	642-645
Number of pages	4
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1032
DOIs	https://doi.org/10.1117/12.969178
Publication status	Published - 7 Jun 1989
Event	18th International Congress on High Speed Photography and Photonics 1988 - Xi'an, China Duration: 28 Aug 1988 → 2 Sep 1988

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.969178

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title = "Digital devices for industrial opto-mechanical high speed thermoviser and its applications in industry and medicine",

abstract = "Two digital devices were developed to enhance the possibilities of high speed thermovisers in thermal nondestructive testing: digital thermograms processor with a memory DTPM-1,2 and microprocessor unit MPT-1. These units could be used either in a single variant or together with a personal computer to increase the reliability of inner defects detection in solids against the specific noise.Principles of thermal tomography are discussed.",

author = "Vavilov, {V. P.} and Shiryaev, {V. V.} and Kiselev, {S. V.}",

year = "1989",

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note = "18th International Congress on High Speed Photography and Photonics 1988 ; Conference date: 28-08-1988 Through 02-09-1988",

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AU - Vavilov, V. P.

AU - Shiryaev, V. V.

AU - Kiselev, S. V.

PY - 1989/6/7

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N2 - Two digital devices were developed to enhance the possibilities of high speed thermovisers in thermal nondestructive testing: digital thermograms processor with a memory DTPM-1,2 and microprocessor unit MPT-1. These units could be used either in a single variant or together with a personal computer to increase the reliability of inner defects detection in solids against the specific noise.Principles of thermal tomography are discussed.

AB - Two digital devices were developed to enhance the possibilities of high speed thermovisers in thermal nondestructive testing: digital thermograms processor with a memory DTPM-1,2 and microprocessor unit MPT-1. These units could be used either in a single variant or together with a personal computer to increase the reliability of inner defects detection in solids against the specific noise.Principles of thermal tomography are discussed.

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