Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement

Abstract

Diffraction radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarises the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. DR can therefore be used to develop non-invasive diagnostic tools. To achieve the micron-scale resolution required to measure the transverse (vertical) beam size using incoherent DR in CLIC, DR in UV and X-ray spectral-range must be investigated. Experimental validation of such a scheme is ongoing at CesrTA at Cornell University, USA. Here we report on the test using 0.5 mm and 1 mm target apertures on a 2.1 GeV electron beam and 400 nm wavelength.

Original language	English
Title of host publication	IBIC 2013
Subtitle of host publication	Proceedings of the 2nd International Beam Instrumentation Conference
Publisher	Joint Accelerator Conferences Website (JACoW)
Pages	619-622
Number of pages	4
ISBN (Electronic)	9783954501274
Publication status	Published - 1 Dec 2013
Externally published	Yes
Event	2nd International Beam Instrumentation Conference, IBIC 2013 - Oxford, United Kingdom Duration: 16 Sep 2013 → 19 Sep 2013

Conference

Conference	2nd International Beam Instrumentation Conference, IBIC 2013
Country	United Kingdom
City	Oxford
Period	16.9.13 → 19.9.13

ASJC Scopus subject areas

Instrumentation
Nuclear and High Energy Physics

Access to Document

Fingerprint Dive into the research topics of 'Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement'. Together they form a unique fingerprint.

Cite this

Bobb, L., Bravin, E., Lefevre, T., Mazzoni, S., Aumeyr, T., Karataev, P., Billing, M., & Conway, J. (2013). Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement. In IBIC 2013: Proceedings of the 2nd International Beam Instrumentation Conference (pp. 619-622). Joint Accelerator Conferences Website (JACoW).

Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement. / Bobb, L.; Bravin, E.; Lefevre, T.; Mazzoni, S.; Aumeyr, T.; Karataev, P.; Billing, M.; Conway, J.

IBIC 2013: Proceedings of the 2nd International Beam Instrumentation Conference. Joint Accelerator Conferences Website (JACoW), 2013. p. 619-622.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Bobb, L, Bravin, E, Lefevre, T, Mazzoni, S, Aumeyr, T, Karataev, P, Billing, M & Conway, J 2013, Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement. in IBIC 2013: Proceedings of the 2nd International Beam Instrumentation Conference. Joint Accelerator Conferences Website (JACoW), pp. 619-622, 2nd International Beam Instrumentation Conference, IBIC 2013, Oxford, United Kingdom, 16.9.13.

@inproceedings{533bd413837c44a7af27aa441ac32d34,

title = "Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement",

abstract = "Diffraction radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarises the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. DR can therefore be used to develop non-invasive diagnostic tools. To achieve the micron-scale resolution required to measure the transverse (vertical) beam size using incoherent DR in CLIC, DR in UV and X-ray spectral-range must be investigated. Experimental validation of such a scheme is ongoing at CesrTA at Cornell University, USA. Here we report on the test using 0.5 mm and 1 mm target apertures on a 2.1 GeV electron beam and 400 nm wavelength.",

author = "L. Bobb and E. Bravin and T. Lefevre and S. Mazzoni and T. Aumeyr and P. Karataev and M. Billing and J. Conway",

year = "2013",

month = dec,

day = "1",

language = "English",

pages = "619--622",

booktitle = "IBIC 2013",

publisher = "Joint Accelerator Conferences Website (JACoW)",

note = "2nd International Beam Instrumentation Conference, IBIC 2013 ; Conference date: 16-09-2013 Through 19-09-2013",

}

TY - GEN

T1 - Diffraction radiation test at cesrta for non-intercepting micron-scale beam size measurement

AU - Bobb, L.

AU - Bravin, E.

AU - Lefevre, T.

AU - Mazzoni, S.

AU - Aumeyr, T.

AU - Karataev, P.

AU - Billing, M.

AU - Conway, J.

PY - 2013/12/1

Y1 - 2013/12/1

N2 - Diffraction radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarises the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. DR can therefore be used to develop non-invasive diagnostic tools. To achieve the micron-scale resolution required to measure the transverse (vertical) beam size using incoherent DR in CLIC, DR in UV and X-ray spectral-range must be investigated. Experimental validation of such a scheme is ongoing at CesrTA at Cornell University, USA. Here we report on the test using 0.5 mm and 1 mm target apertures on a 2.1 GeV electron beam and 400 nm wavelength.

AB - Diffraction radiation (DR) is produced when a relativistic charged particle moves in the vicinity of a medium. The electric field of the charged particle polarises the target atoms which then oscillate, emitting radiation with a very broad spectrum. The spatial-spectral properties of DR are sensitive to a range of electron beam parameters. Furthermore, the energy loss due to DR is so small that the electron beam parameters are unchanged. DR can therefore be used to develop non-invasive diagnostic tools. To achieve the micron-scale resolution required to measure the transverse (vertical) beam size using incoherent DR in CLIC, DR in UV and X-ray spectral-range must be investigated. Experimental validation of such a scheme is ongoing at CesrTA at Cornell University, USA. Here we report on the test using 0.5 mm and 1 mm target apertures on a 2.1 GeV electron beam and 400 nm wavelength.

UR - http://www.scopus.com/inward/record.url?scp=84920546133&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84920546133&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84920546133

SP - 619

EP - 622

BT - IBIC 2013

PB - Joint Accelerator Conferences Website (JACoW)

T2 - 2nd International Beam Instrumentation Conference, IBIC 2013

Y2 - 16 September 2013 through 19 September 2013

ER -