Development of high resolution shearography device for non-destructive testing of composite materials

Mikhail Burkov, Pavel Lyubutin, Anton Byakov, Sergey Panin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The paper presents the results of preliminary testing of high-resolution shearographic device and software for signal processing to be applied for non-destructive evaluation (NDE) of composite materials. Shearography is an interferometric non-contact NDT/E method that allows obtaining strain data straightly at video frame rate to diagnose different composite structures to provide the safe operation of the structure and reduce the possibility of accidents. The optical part of the device based on the Canon 450D DSLR camera is described. The tests have been performed to ensure the proper functioning of the device and to establish the image processing technique.

Original languageEnglish
Title of host publicationAdvanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
PublisherAmerican Institute of Physics Inc.
Volume1683
ISBN (Electronic)9780735413306
DOIs
Publication statusPublished - 27 Oct 2015
EventInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015 - Tomsk, Russian Federation
Duration: 21 Sep 201525 Sep 2015

Conference

ConferenceInternational Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015
CountryRussian Federation
CityTomsk
Period21.9.1525.9.15

Fingerprint

shearography
composite materials
high resolution
composite structures
accidents
image processing
signal processing
cameras
computer programs
evaluation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Burkov, M., Lyubutin, P., Byakov, A., & Panin, S. (2015). Development of high resolution shearography device for non-destructive testing of composite materials. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Vol. 1683). [020029] American Institute of Physics Inc.. https://doi.org/10.1063/1.4932719

Development of high resolution shearography device for non-destructive testing of composite materials. / Burkov, Mikhail; Lyubutin, Pavel; Byakov, Anton; Panin, Sergey.

Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. Vol. 1683 American Institute of Physics Inc., 2015. 020029.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Burkov, M, Lyubutin, P, Byakov, A & Panin, S 2015, Development of high resolution shearography device for non-destructive testing of composite materials. in Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. vol. 1683, 020029, American Institute of Physics Inc., International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015, Tomsk, Russian Federation, 21.9.15. https://doi.org/10.1063/1.4932719
Burkov M, Lyubutin P, Byakov A, Panin S. Development of high resolution shearography device for non-destructive testing of composite materials. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. Vol. 1683. American Institute of Physics Inc. 2015. 020029 https://doi.org/10.1063/1.4932719
Burkov, Mikhail ; Lyubutin, Pavel ; Byakov, Anton ; Panin, Sergey. / Development of high resolution shearography device for non-destructive testing of composite materials. Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. Vol. 1683 American Institute of Physics Inc., 2015.
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