Development of high resolution shearography device for non-destructive testing of composite materials

Mikhail Burkov, Pavel Lyubutin, Anton Byakov, Sergey Panin

Division for Materials Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The paper presents the results of preliminary testing of high-resolution shearographic device and software for signal processing to be applied for non-destructive evaluation (NDE) of composite materials. Shearography is an interferometric non-contact NDT/E method that allows obtaining strain data straightly at video frame rate to diagnose different composite structures to provide the safe operation of the structure and reduce the possibility of accidents. The optical part of the device based on the Canon 450D DSLR camera is described. The tests have been performed to ensure the proper functioning of the device and to establish the image processing technique.

Original language	English
Title of host publication	Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures
Publisher	American Institute of Physics Inc.
Volume	1683
ISBN (Electronic)	9780735413306
DOIs	https://doi.org/10.1063/1.4932719
Publication status	Published - 27 Oct 2015
Event	International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015 - Tomsk, Russian Federation Duration: 21 Sep 2015 → 25 Sep 2015

Conference

Conference	International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015
Country	Russian Federation
City	Tomsk
Period	21.9.15 → 25.9.15

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ASJC Scopus subject areas

Physics and Astronomy(all)

Cite this

Burkov, M., Lyubutin, P., Byakov, A., & Panin, S. (2015). Development of high resolution shearography device for non-destructive testing of composite materials. In Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures (Vol. 1683). [020029] American Institute of Physics Inc.. https://doi.org/10.1063/1.4932719

Development of high resolution shearography device for non-destructive testing of composite materials. / Burkov, Mikhail; Lyubutin, Pavel; Byakov, Anton; Panin, Sergey.

Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. Vol. 1683 American Institute of Physics Inc., 2015. 020029.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Burkov, M, Lyubutin, P, Byakov, A & Panin, S 2015, Development of high resolution shearography device for non-destructive testing of composite materials. in Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures. vol. 1683, 020029, American Institute of Physics Inc., International Conference on Advanced Materials with Hierarchical Structure for New Technologies and Reliable Structures 2015, Tomsk, Russian Federation, 21.9.15. https://doi.org/10.1063/1.4932719

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Access to Document

10.1063/1.4932719