Determination of the test-samples electron density via dual energy computer tomography

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Abstract

In this work we determines electron density using data obtained via CT scanner with one radiation source operating in two modes: with 80 kV and 120 kV voltage. We perform tomography study of calibration phantom with predetermined electron densities. Single linear relationship between energy-subtracted Hounsfield unit and relative electron density is determined. Using determined relationship the relative electron densities of phantom calibration samples is calculated. The comparison of calculated and nominal values proves the possibility of the samples relative electron density determination using energy-subtracted Hounsfield unit with error less than 2%.

Original languageEnglish
Article number012021
JournalJournal of Physics: Conference Series
Volume1843
Issue number1
DOIs
Publication statusPublished - 19 Mar 2021
Event10th International Scientific and Practical Conference Information and Measuring Equipment and Technologies, IMET 2020 - Tomsk, Virtual, Russian Federation
Duration: 24 Nov 202026 Nov 2020

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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