Determination of overlapping peaks heights by tangent method

Ekaterina Larionova, Serge Romanenko

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this work the tangent approach is valid on example of overlapping voltammetric peaks of Cd (II) and Tl (I) at their different concentration in a mixture. Height of the frame plotted by inflectional tangents to the inflection points on peak branches is used as a peak maximum for calibration curve plotting. It is founded that systematic errors are not significant for the measurement of Tl (I) peak. In case of the Cd (II) peak the significant systematic error arising from tailing of the ascending part of Tl (I) peak is observed. We propose a method of systematic errors compensation. Systematic errors are estimated by peak series modeling. We use six parametric peak model with help of a priory information about signal shape and real values of resolution criteria and ratios of peaks heights. Peak shape is determined by difference method and ratios of peak heights by calibration curve.

Original languageEnglish
Title of host publicationProceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012
DOIs
Publication statusPublished - 2012
Event2012 7th International Forum on Strategic Technology, IFOST 2012 - Tomsk, Russian Federation
Duration: 18 Sep 201221 Sep 2012

Other

Other2012 7th International Forum on Strategic Technology, IFOST 2012
CountryRussian Federation
CityTomsk
Period18.9.1221.9.12

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Keywords

  • overlapping peaks
  • stripping voltammetry
  • systematic errors
  • tangent method

ASJC Scopus subject areas

  • Management of Technology and Innovation

Cite this

Larionova, E., & Romanenko, S. (2012). Determination of overlapping peaks heights by tangent method. In Proceedings - 2012 7th International Forum on Strategic Technology, IFOST 2012 [6357742] https://doi.org/10.1109/IFOST.2012.6357742