Determination of light trace elements in surface layers

R. P. Meshcheryakov, I. P. Chernov, A. N. Oblivantsev, B. I. Kuznetsov, G. I. Tronov, A. G. Rybasov

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


A method is presented for determining the concentration of light elements in a surface layer up to 15 μm deep, utilizing the anomalous increase in elastic scattering cross-sectional area when high-energy alpha-particles are scattered by light nuclei through large angles. For the separation of the short-lived nuclide17F, isotope-exchange between the solid and liquid phases was applied.

Original languageEnglish
Pages (from-to)427-438
Number of pages12
JournalJournal of Radioanalytical Chemistry
Issue number2
Publication statusPublished - Sep 1973

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Molecular Medicine

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