Determination of light trace elements in surface layers

R. P. Meshcheryakov, I. P. Chernov, A. N. Oblivantsev, B. I. Kuznetsov, G. I. Tronov, A. G. Rybasov

Division for Experimental Physics

Research output: Contribution to journal › Article

Abstract

A method is presented for determining the concentration of light elements in a surface layer up to 15 μm deep, utilizing the anomalous increase in elastic scattering cross-sectional area when high-energy alpha-particles are scattered by light nuclei through large angles. For the separation of the short-lived nuclide¹⁷F, isotope-exchange between the solid and liquid phases was applied.

Original language	English
Pages (from-to)	427-438
Number of pages	12
Journal	Journal of Radioanalytical Chemistry
Volume	16
Issue number	2
DOIs	https://doi.org/10.1007/BF02514173
Publication status	Published - Sep 1973

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ASJC Scopus subject areas

Radiology Nuclear Medicine and imaging
Molecular Medicine

Cite this

Meshcheryakov, R. P., Chernov, I. P., Oblivantsev, A. N., Kuznetsov, B. I., Tronov, G. I., & Rybasov, A. G. (1973). Determination of light trace elements in surface layers. Journal of Radioanalytical Chemistry, 16(2), 427-438. https://doi.org/10.1007/BF02514173

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author = "Meshcheryakov, {R. P.} and Chernov, {I. P.} and Oblivantsev, {A. N.} and Kuznetsov, {B. I.} and Tronov, {G. I.} and Rybasov, {A. G.}",

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AU - Oblivantsev, A. N.

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AU - Tronov, G. I.

AU - Rybasov, A. G.

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Access to Document

10.1007/BF02514173