Determination of light trace elements in surface layers

R. P. Meshcheryakov, I. P. Chernov, A. N. Oblivantsev, B. I. Kuznetsov, G. I. Tronov, A. G. Rybasov

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A method is presented for determining the concentration of light elements in a surface layer up to 15 μm deep, utilizing the anomalous increase in elastic scattering cross-sectional area when high-energy alpha-particles are scattered by light nuclei through large angles. For the separation of the short-lived nuclide17F, isotope-exchange between the solid and liquid phases was applied.

Original languageEnglish
Pages (from-to)427-438
Number of pages12
JournalJournal of Radioanalytical Chemistry
Volume16
Issue number2
DOIs
Publication statusPublished - Sep 1973

ASJC Scopus subject areas

  • Radiology Nuclear Medicine and imaging
  • Molecular Medicine

Fingerprint Dive into the research topics of 'Determination of light trace elements in surface layers'. Together they form a unique fingerprint.

  • Cite this

    Meshcheryakov, R. P., Chernov, I. P., Oblivantsev, A. N., Kuznetsov, B. I., Tronov, G. I., & Rybasov, A. G. (1973). Determination of light trace elements in surface layers. Journal of Radioanalytical Chemistry, 16(2), 427-438. https://doi.org/10.1007/BF02514173