Abstract
Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
| Original language | English |
|---|---|
| Pages (from-to) | 372-374 |
| Number of pages | 3 |
| Journal | The Soviet journal of nondestructive testing |
| Volume | 19 |
| Issue number | 5 |
| Publication status | Published - May 1983 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
Bragina, L. A., Vavilov, V. P., Ivanov, A. I., Korol'kov, O. M., Surzhenkov, G. N., & Khutoryanskii, E. D. (1983). DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. The Soviet journal of nondestructive testing, 19(5), 372-374.