DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.

L. A. Bragina, V. P. Vavilov, A. I. Ivanov, O. M. Korol'kov, G. N. Surzhenkov, E. D. Khutoryanskii

Research output: Contribution to journalArticle

Abstract

Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.

Original languageEnglish
Pages (from-to)372-374
Number of pages3
JournalThe Soviet journal of nondestructive testing
Volume19
Issue number5
Publication statusPublished - May 1983

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Semiconductor devices
Nondestructive examination
Welding
Defects
Hot Temperature

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Bragina, L. A., Vavilov, V. P., Ivanov, A. I., Korol'kov, O. M., Surzhenkov, G. N., & Khutoryanskii, E. D. (1983). DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. The Soviet journal of nondestructive testing, 19(5), 372-374.

DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. / Bragina, L. A.; Vavilov, V. P.; Ivanov, A. I.; Korol'kov, O. M.; Surzhenkov, G. N.; Khutoryanskii, E. D.

In: The Soviet journal of nondestructive testing, Vol. 19, No. 5, 05.1983, p. 372-374.

Research output: Contribution to journalArticle

Bragina, LA, Vavilov, VP, Ivanov, AI, Korol'kov, OM, Surzhenkov, GN & Khutoryanskii, ED 1983, 'DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.', The Soviet journal of nondestructive testing, vol. 19, no. 5, pp. 372-374.
Bragina LA, Vavilov VP, Ivanov AI, Korol'kov OM, Surzhenkov GN, Khutoryanskii ED. DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. The Soviet journal of nondestructive testing. 1983 May;19(5):372-374.
Bragina, L. A. ; Vavilov, V. P. ; Ivanov, A. I. ; Korol'kov, O. M. ; Surzhenkov, G. N. ; Khutoryanskii, E. D. / DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. In: The Soviet journal of nondestructive testing. 1983 ; Vol. 19, No. 5. pp. 372-374.
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