Abstract
Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
| Original language | English |
|---|---|
| Pages (from-to) | 372-374 |
| Number of pages | 3 |
| Journal | The Soviet journal of nondestructive testing |
| Volume | 19 |
| Issue number | 5 |
| Publication status | Published - May 1983 |
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ASJC Scopus subject areas
- Engineering(all)
Cite this
DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. / Bragina, L. A.; Vavilov, V. P.; Ivanov, A. I.; Korol'kov, O. M.; Surzhenkov, G. N.; Khutoryanskii, E. D.
In: The Soviet journal of nondestructive testing, Vol. 19, No. 5, 05.1983, p. 372-374.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.
AU - Bragina, L. A.
AU - Vavilov, V. P.
AU - Ivanov, A. I.
AU - Korol'kov, O. M.
AU - Surzhenkov, G. N.
AU - Khutoryanskii, E. D.
PY - 1983/5
Y1 - 1983/5
N2 - Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
AB - Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.
UR - http://www.scopus.com/inward/record.url?scp=0020747406&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0020747406&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0020747406
VL - 19
SP - 372
EP - 374
JO - Soviet Journal of Nondestructive Testing
JF - Soviet Journal of Nondestructive Testing
SN - 0038-5492
IS - 5
ER -