DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.

L. A. Bragina, V. P. Vavilov, A. I. Ivanov, O. M. Korol'kov, G. N. Surzhenkov, E. D. Khutoryanskii

Research output: Contribution to journalArticle

Abstract

Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.

Original languageEnglish
Pages (from-to)372-374
Number of pages3
JournalThe Soviet journal of nondestructive testing
Volume19
Issue number5
Publication statusPublished - May 1983

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Bragina, L. A., Vavilov, V. P., Ivanov, A. I., Korol'kov, O. M., Surzhenkov, G. N., & Khutoryanskii, E. D. (1983). DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS. The Soviet journal of nondestructive testing, 19(5), 372-374.