DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.

L. A. Bragina, V. P. Vavilov, A. I. Ivanov, O. M. Korol'kov, G. N. Surzhenkov, E. D. Khutoryanskii

Center for Industrial Tomography

Research output: Contribution to journal › Article › peer-review

Abstract

Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.

Original language	English
Pages (from-to)	372-374
Number of pages	3
Journal	The Soviet journal of nondestructive testing
Volume	19
Issue number	5
Publication status	Published - May 1983

ASJC Scopus subject areas

Engineering(all)

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@article{444c56ff824a44f8a2f9c9e3a9c80b8e,

title = "DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.",

abstract = "Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.",

author = "Bragina, {L. A.} and Vavilov, {V. P.} and Ivanov, {A. I.} and Korol'kov, {O. M.} and Surzhenkov, {G. N.} and Khutoryanskii, {E. D.}",

year = "1983",

month = may,

language = "English",

volume = "19",

pages = "372--374",

journal = "Soviet Journal of Nondestructive Testing",

issn = "0038-5492",

publisher = "Consultants Bureau",

number = "5",

}

TY - JOUR

T1 - DETECTION OF DIFFUSION WELDING DEFECTS BY THERMAL NDT OF RECTIFIER ELEMENTS.

AU - Bragina, L. A.

AU - Vavilov, V. P.

AU - Ivanov, A. I.

AU - Korol'kov, O. M.

AU - Surzhenkov, G. N.

AU - Khutoryanskii, E. D.

PY - 1983/5

Y1 - 1983/5

N2 - Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.

AB - Problems of flaw detection in contact joints in rectifier elements (RE) of semiconductor devices are considered investigating the possibility of applying thermal nondestructive testing to such elements.

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UR - http://www.scopus.com/inward/citedby.url?scp=0020747406&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0020747406

VL - 19

SP - 372

EP - 374

JO - Soviet Journal of Nondestructive Testing

JF - Soviet Journal of Nondestructive Testing

SN - 0038-5492

IS - 5

ER -