Abstract
The article is devoted to the current problem of enterprise competitiveness rise in hard and competitive terms of business environment. The importance of modern equipment for detection of defects and their correction is explained. Production of chipboard is used as an object of research. Short description and main results of estimation efficiency of innovative solutions of enterprises are considered.
| Original language | English |
|---|---|
| Article number | 012070 |
| Journal | IOP Conference Series: Materials Science and Engineering |
| Volume | 110 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 23 Feb 2016 |
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Keywords
- chipboard
- control
- defect
- losses
- parameter
- production
ASJC Scopus subject areas
- Engineering(all)
- Materials Science(all)
Cite this
Detection and defect correction of operating process. / Vasendina, Elena; Plotnikova, Inna; Levitskaya, Anastasiya; Kvesko, Svetlana.
In: IOP Conference Series: Materials Science and Engineering, Vol. 110, No. 1, 012070, 23.02.2016.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Detection and defect correction of operating process
AU - Vasendina, Elena
AU - Plotnikova, Inna
AU - Levitskaya, Anastasiya
AU - Kvesko, Svetlana
PY - 2016/2/23
Y1 - 2016/2/23
N2 - The article is devoted to the current problem of enterprise competitiveness rise in hard and competitive terms of business environment. The importance of modern equipment for detection of defects and their correction is explained. Production of chipboard is used as an object of research. Short description and main results of estimation efficiency of innovative solutions of enterprises are considered.
AB - The article is devoted to the current problem of enterprise competitiveness rise in hard and competitive terms of business environment. The importance of modern equipment for detection of defects and their correction is explained. Production of chipboard is used as an object of research. Short description and main results of estimation efficiency of innovative solutions of enterprises are considered.
KW - chipboard
KW - control
KW - defect
KW - losses
KW - parameter
KW - production
UR - http://www.scopus.com/inward/record.url?scp=84971618279&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84971618279&partnerID=8YFLogxK
U2 - 10.1088/1757-899X/110/1/012070
DO - 10.1088/1757-899X/110/1/012070
M3 - Article
VL - 110
JO - IOP Conference Series: Materials Science and Engineering
JF - IOP Conference Series: Materials Science and Engineering
SN - 1757-8981
IS - 1
M1 - 012070
ER -