Abstract
To provide an adequate X-ray detection efficiency is a real challenge to designers of digital radiographic systems for different applications, including medicine, biology, and nondestructive testing of materials and structural members. Analysis of the state-of-the art digital radiographic systems shows that the greatest body of information is obtained from imaging systems based on semiconductor X-ray detectors (Si, GaAs, Cd1-xZnxTe). Results of development of detecting unit for x-ray nondestructive testing systems are described in this paper.
Original language | English |
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Title of host publication | 2015 International Siberian Conference on Control and Communications, SIBCON 2015 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781479971022 |
DOIs | |
Publication status | Published - 1 Jul 2015 |
Event | 2015 International Siberian Conference on Control and Communications, SIBCON 2015 - Omsk, Russian Federation Duration: 21 May 2015 → 23 May 2015 |
Conference
Conference | 2015 International Siberian Conference on Control and Communications, SIBCON 2015 |
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Country | Russian Federation |
City | Omsk |
Period | 21.5.15 → 23.5.15 |
Keywords
- detecting unit
- nondestructive testing
- x-ray
ASJC Scopus subject areas
- Computer Networks and Communications
- Control and Systems Engineering