Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation

Andrey V. Batranin, Sergey Vladimirovich Chakhlov, Dmitry V. Grinev, Boris I. Kapranov, Vasiliy A. Klimenov

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

9 Citations (Scopus)

Abstract

This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.

Original languageEnglish
Title of host publicationApplied Mechanics and Materials
Pages3-10
Number of pages8
Volume379
DOIs
Publication statusPublished - 2013
Event4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering") - Yurga, Russian Federation
Duration: 23 May 2013 → 25 May 2013

Publication series

NameApplied Mechanics and Materials
Volume379
ISSN (Print)16609336
ISSN (Electronic)16627482

Conference

Conference4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering")
CountryRussian Federation
CityYurga
Period23.5.13 → 25.5.13

Keywords

  • Computed tomography
  • Micro-CT scanner
  • Non-destructive evaluation
  • X-ray

ASJC Scopus subject areas

  • Engineering(all)

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