Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation

Abstract

This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.

Original language	English
Title of host publication	Applied Mechanics and Materials
Pages	3-10
Number of pages	8
Volume	379
DOIs	https://doi.org/10.4028/www.scientific.net/AMM.379.3
Publication status	Published - 2013
Event	4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering") - Yurga, Russian Federation Duration: 23 May 2013 → 25 May 2013

Publication series

Name	Applied Mechanics and Materials
Volume	379
ISSN (Print)	16609336
ISSN (Electronic)	16627482

Conference

Conference	4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering")
Country	Russian Federation
City	Yurga
Period	23.5.13 → 25.5.13

Keywords

Computed tomography
Micro-CT scanner
Non-destructive evaluation
X-ray

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.4028/www.scientific.net/AMM.379.3

Fingerprint Dive into the research topics of 'Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation'. Together they form a unique fingerprint.

Cite this

Batranin, A. V., Chakhlov, SV., Grinev, D. V., Kapranov, B. I., & Klimenov, V. A. (2013). Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation. In Applied Mechanics and Materials (Vol. 379, pp. 3-10). (Applied Mechanics and Materials; Vol. 379). https://doi.org/10.4028/www.scientific.net/AMM.379.3

Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation. / Batranin, Andrey V.; Chakhlov, Sergey Vladimirovich; Grinev, Dmitry V.; Kapranov, Boris I.; Klimenov, Vasiliy A.

Applied Mechanics and Materials. Vol. 379 2013. p. 3-10 (Applied Mechanics and Materials; Vol. 379).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Batranin, AV , Chakhlov, SV, Grinev, DV, Kapranov, BI & Klimenov, VA 2013, Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation. in Applied Mechanics and Materials. vol. 379, Applied Mechanics and Materials, vol. 379, pp. 3-10, 4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering"), Yurga, Russian Federation, 23.5.13. https://doi.org/10.4028/www.scientific.net/AMM.379.3

@inproceedings{b90ff74175d74aac994995276401538b,

title = "Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation",

abstract = "This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.",

keywords = "Computed tomography, Micro-CT scanner, Non-destructive evaluation, X-ray",

author = "Batranin, {Andrey V.} and Sergey Vladimirovich Chakhlov and Grinev, {Dmitry V.} and Kapranov, {Boris I.} and Klimenov, {Vasiliy A.}",

year = "2013",

doi = "10.4028/www.scientific.net/AMM.379.3",

language = "English",

isbn = "9783037857991",

volume = "379",

series = "Applied Mechanics and Materials",

pages = "3--10",

booktitle = "Applied Mechanics and Materials",

note = "4th International Scientific Practical Conference with Elements of School for Junior Scientists ({"}Innovative Technologies and Economics in Engineering{"}) ; Conference date: 23-05-2013 Through 25-05-2013",

}

TY - GEN

T1 - Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation

AU - Batranin, Andrey V.

AU - Chakhlov, Sergey Vladimirovich

AU - Grinev, Dmitry V.

AU - Kapranov, Boris I.

AU - Klimenov, Vasiliy A.

PY - 2013

Y1 - 2013

N2 - This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.

AB - This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.

KW - Computed tomography

KW - Micro-CT scanner

KW - Non-destructive evaluation

KW - X-ray

UR - http://www.scopus.com/inward/record.url?scp=84884765950&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84884765950&partnerID=8YFLogxK

U2 - 10.4028/www.scientific.net/AMM.379.3

DO - 10.4028/www.scientific.net/AMM.379.3

M3 - Conference contribution

AN - SCOPUS:84884765950

SN - 9783037857991

VL - 379

T3 - Applied Mechanics and Materials

SP - 3

EP - 10

BT - Applied Mechanics and Materials

T2 - 4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering")

Y2 - 23 May 2013 through 25 May 2013

ER -