Abstract
This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.
| Original language | English |
|---|---|
| Title of host publication | Applied Mechanics and Materials |
| Pages | 3-10 |
| Number of pages | 8 |
| Volume | 379 |
| DOIs | |
| Publication status | Published - 2013 |
| Event | 4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering") - Yurga, Russian Federation Duration: 23 May 2013 → 25 May 2013 |
Publication series
| Name | Applied Mechanics and Materials |
|---|---|
| Volume | 379 |
| ISSN (Print) | 16609336 |
| ISSN (Electronic) | 16627482 |
Conference
| Conference | 4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering") |
|---|---|
| Country | Russian Federation |
| City | Yurga |
| Period | 23.5.13 → 25.5.13 |
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Keywords
- Computed tomography
- Micro-CT scanner
- Non-destructive evaluation
- X-ray
ASJC Scopus subject areas
- Engineering(all)
Cite this
Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation. / Batranin, Andrey V.; Chakhlov, Sergey Vladimirovich; Grinev, Dmitry V.; Kapranov, Boris I.; Klimenov, Vasiliy A.
Applied Mechanics and Materials. Vol. 379 2013. p. 3-10 (Applied Mechanics and Materials; Vol. 379).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation
AU - Batranin, Andrey V.
AU - Chakhlov, Sergey Vladimirovich
AU - Grinev, Dmitry V.
AU - Kapranov, Boris I.
AU - Klimenov, Vasiliy A.
PY - 2013
Y1 - 2013
N2 - This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.
AB - This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.
KW - Computed tomography
KW - Micro-CT scanner
KW - Non-destructive evaluation
KW - X-ray
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UR - http://www.scopus.com/inward/citedby.url?scp=84884765950&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/AMM.379.3
DO - 10.4028/www.scientific.net/AMM.379.3
M3 - Conference contribution
AN - SCOPUS:84884765950
SN - 9783037857991
VL - 379
T3 - Applied Mechanics and Materials
SP - 3
EP - 10
BT - Applied Mechanics and Materials
ER -