TY - GEN
T1 - Design of the X-ray micro-CT scanner TOLMI-150-10 and its perspective application in non-destructive evaluation
AU - Batranin, Andrey V.
AU - Chakhlov, Sergey Vladimirovich
AU - Grinev, Dmitry V.
AU - Kapranov, Boris I.
AU - Klimenov, Vasiliy A.
PY - 2013
Y1 - 2013
N2 - This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.
AB - This paper presents the X-ray micro-CT scanner TOLMI-150-10 developed at Tomsk Polytechnic University. The scanner is used for non-destructive evaluation of materials and industrial samples by means of the X-ray micro-computed tomography (micro-CT). The key technical specifications and design of the scanner are presented in this paper. In addition, a number of examples for non-destructive evaluation are given. Recent results, obtained using the TOMLI system, are compared with those acquired with an existing commercial tomographic imaging solution.
KW - Computed tomography
KW - Micro-CT scanner
KW - Non-destructive evaluation
KW - X-ray
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U2 - 10.4028/www.scientific.net/AMM.379.3
DO - 10.4028/www.scientific.net/AMM.379.3
M3 - Conference contribution
AN - SCOPUS:84884765950
SN - 9783037857991
VL - 379
T3 - Applied Mechanics and Materials
SP - 3
EP - 10
BT - Applied Mechanics and Materials
T2 - 4th International Scientific Practical Conference with Elements of School for Junior Scientists ("Innovative Technologies and Economics in Engineering")
Y2 - 23 May 2013 through 25 May 2013
ER -