Abstract
The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - KORUS 2003 |
| Subtitle of host publication | 7th Korea-Russia International Symposium on Science and Technology |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 132-137 |
| Number of pages | 6 |
| Volume | 2 |
| ISBN (Electronic) | 8978686184, 9788978686181 |
| Publication status | Published - 1 Jan 2003 |
| Event | 7th Korea-Russia International Symposium on Science and Technology, KORUS 2003 - Ulsan, Korea, Republic of Duration: 28 Jun 2003 → 6 Jul 2003 |
Conference
| Conference | 7th Korea-Russia International Symposium on Science and Technology, KORUS 2003 |
|---|---|
| Country | Korea, Republic of |
| City | Ulsan |
| Period | 28.6.03 → 6.7.03 |
Fingerprint
Keywords
- Control systems
- Fractals
- Friction
- Graphics
- Hardware
- Image analysis
- Scanning electron microscopy
- Software packages
- Software systems
- Wavelet analysis
ASJC Scopus subject areas
- Building and Construction
- Pollution
- Biotechnology
- Social Sciences (miscellaneous)
- Medicine (miscellaneous)
- Education
Cite this
Design of soft hardware for image input and analysis on the base of scanning electron microscope. / Shakirov, I.; Panin, S.; Pochivalov, Y.
Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 2003. p. 132-137 1222590.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Design of soft hardware for image input and analysis on the base of scanning electron microscope
AU - Shakirov, I.
AU - Panin, S.
AU - Pochivalov, Y.
PY - 2003/1/1
Y1 - 2003/1/1
N2 - The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.
AB - The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.
KW - Control systems
KW - Fractals
KW - Friction
KW - Graphics
KW - Hardware
KW - Image analysis
KW - Scanning electron microscopy
KW - Software packages
KW - Software systems
KW - Wavelet analysis
UR - http://www.scopus.com/inward/record.url?scp=84944312115&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84944312115&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:84944312115
VL - 2
SP - 132
EP - 137
BT - Proceedings - KORUS 2003
PB - Institute of Electrical and Electronics Engineers Inc.
ER -