Design of soft hardware for image input and analysis on the base of scanning electron microscope

I. Shakirov, S. Panin, Y. Pochivalov

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.

Original languageEnglish
Title of host publicationProceedings - KORUS 2003
Subtitle of host publication7th Korea-Russia International Symposium on Science and Technology
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages132-137
Number of pages6
Volume2
ISBN (Electronic)8978686184, 9788978686181
Publication statusPublished - 1 Jan 2003
Event7th Korea-Russia International Symposium on Science and Technology, KORUS 2003 - Ulsan, Korea, Republic of
Duration: 28 Jun 20036 Jul 2003

Conference

Conference7th Korea-Russia International Symposium on Science and Technology, KORUS 2003
CountryKorea, Republic of
CityUlsan
Period28.6.036.7.03

Fingerprint

hardware
Electron microscopes
Software
Friction
Wear of materials
Electrons
Scanning
Hardware
Fractal dimension
Software packages
Spectrum analysis
energy
Wavelet Analysis
Fractals
Coatings
Scanning electron microscopy
Spectrum Analysis
Experiments
experiment
software

Keywords

  • Control systems
  • Fractals
  • Friction
  • Graphics
  • Hardware
  • Image analysis
  • Scanning electron microscopy
  • Software packages
  • Software systems
  • Wavelet analysis

ASJC Scopus subject areas

  • Building and Construction
  • Pollution
  • Biotechnology
  • Social Sciences (miscellaneous)
  • Medicine (miscellaneous)
  • Education

Cite this

Shakirov, I., Panin, S., & Pochivalov, Y. (2003). Design of soft hardware for image input and analysis on the base of scanning electron microscope. In Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology (Vol. 2, pp. 132-137). [1222590] Institute of Electrical and Electronics Engineers Inc..

Design of soft hardware for image input and analysis on the base of scanning electron microscope. / Shakirov, I.; Panin, S.; Pochivalov, Y.

Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 2003. p. 132-137 1222590.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shakirov, I, Panin, S & Pochivalov, Y 2003, Design of soft hardware for image input and analysis on the base of scanning electron microscope. in Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology. vol. 2, 1222590, Institute of Electrical and Electronics Engineers Inc., pp. 132-137, 7th Korea-Russia International Symposium on Science and Technology, KORUS 2003, Ulsan, Korea, Republic of, 28.6.03.
Shakirov I, Panin S, Pochivalov Y. Design of soft hardware for image input and analysis on the base of scanning electron microscope. In Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology. Vol. 2. Institute of Electrical and Electronics Engineers Inc. 2003. p. 132-137. 1222590
Shakirov, I. ; Panin, S. ; Pochivalov, Y. / Design of soft hardware for image input and analysis on the base of scanning electron microscope. Proceedings - KORUS 2003: 7th Korea-Russia International Symposium on Science and Technology. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 2003. pp. 132-137
@inproceedings{8c1a0f958d44412da11ef789abe59261,
title = "Design of soft hardware for image input and analysis on the base of scanning electron microscope",
abstract = "The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.",
keywords = "Control systems, Fractals, Friction, Graphics, Hardware, Image analysis, Scanning electron microscopy, Software packages, Software systems, Wavelet analysis",
author = "I. Shakirov and S. Panin and Y. Pochivalov",
year = "2003",
month = "1",
day = "1",
language = "English",
volume = "2",
pages = "132--137",
booktitle = "Proceedings - KORUS 2003",
publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Design of soft hardware for image input and analysis on the base of scanning electron microscope

AU - Shakirov, I.

AU - Panin, S.

AU - Pochivalov, Y.

PY - 2003/1/1

Y1 - 2003/1/1

N2 - The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.

AB - The software hardware system for image input and analysis was designed that consists of nonexpensive commercially-available data digitizing board, software for its driving and control under MS-Windows'98, 2000 operational systems and software package for 2D wavelet-spectrum analysis. The latter, as contrary to unique value of fractal dimension provides graphic representation of X, Y and Z components of wavelet-spectrum and numerical values of their energy and local intermittency measure using Doubechi wavelets of different types. Experiments on wear in friction pairs were performed to evaluate the quality of SEM-images obtained and to investigate the pattern of wavelet-spectrum energy under wear and friction of structural materials and coating.

KW - Control systems

KW - Fractals

KW - Friction

KW - Graphics

KW - Hardware

KW - Image analysis

KW - Scanning electron microscopy

KW - Software packages

KW - Software systems

KW - Wavelet analysis

UR - http://www.scopus.com/inward/record.url?scp=84944312115&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84944312115&partnerID=8YFLogxK

M3 - Conference contribution

VL - 2

SP - 132

EP - 137

BT - Proceedings - KORUS 2003

PB - Institute of Electrical and Electronics Engineers Inc.

ER -