Crystallographic analysis of rock grain orientation at meso- and microscale levels

A. S. Kulkov, A. I. Chernishov, D. V. Lychagin, P. A. Tishin, S. N. Kulkov

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    This paper studies the results of electron backscatter diffraction analysis of naturally deformed polycrystalline olivine. It also defines the dependence of lattice-preferred orientations of grains on their microstructural position and size. The authors detect the basic mechanisms, consequence and thermal dynamic modes of deformation. They also show that the development of a polycrystalline structure is determined by the following consecutive activation of sliding systems (010)[100] → {0kl}[100] → (100)[010] → {100}[001] → {110}[001], when dislocation sliding and diffusion creep change under the temperature decrease from 1000°C to 650°C.

    Original languageEnglish
    Title of host publicationAIP Conference Proceedings
    PublisherAmerican Institute of Physics Inc.
    Pages323-326
    Number of pages4
    Volume1623
    ISBN (Print)9780735412606
    DOIs
    Publication statusPublished - 2014
    EventInternational Conference on Physical Mesomechanics of Multilevel Systems 2014 - Tomsk, Russian Federation
    Duration: 3 Sep 20145 Sep 2014

    Other

    OtherInternational Conference on Physical Mesomechanics of Multilevel Systems 2014
    CountryRussian Federation
    CityTomsk
    Period3.9.145.9.14

    Keywords

    • EBSD
    • Lattice-preferred orientation
    • Olivine
    • Plastic deformation

    ASJC Scopus subject areas

    • Physics and Astronomy(all)

    Fingerprint Dive into the research topics of 'Crystallographic analysis of rock grain orientation at meso- and microscale levels'. Together they form a unique fingerprint.

  • Cite this

    Kulkov, A. S., Chernishov, A. I., Lychagin, D. V., Tishin, P. A., & Kulkov, S. N. (2014). Crystallographic analysis of rock grain orientation at meso- and microscale levels. In AIP Conference Proceedings (Vol. 1623, pp. 323-326). American Institute of Physics Inc.. https://doi.org/10.1063/1.4898947