Abstract
Ultrasound-stimulated IR thermography, thanks to its large-area imaging capability, high test productivity and safety, is a powerful tool for the inspection of cracks in heavy aluminum structures. In thick aluminum parts, the most important defect detection parameters are the differential temperature signal and signal-to-noise ratio (SNR), which typically reach their maximums at shortly (under 1 s) after the beginning of the ultrasonic excitation. In the IR inspection of non-metals, the ultrasonic excitation may be relatively long, while in the case of highly-conductive aluminum, short-pulse (burst) stimulation (from 0.4 to 1 s) is sufficient The crack detectability can be improved by evaluating temperature images at the times when maximum SNR values occur. Further enhancement of test results can be achieved by applying some data processing algorithms which can be 1D, i.e. applied to temperature evolutions in time, or 2D, i.e. applied to spatial coordinates, or a single image.
| Original language | English |
|---|---|
| Pages (from-to) | 149-156 |
| Number of pages | 8 |
| Journal | Infrared Physics and Technology |
| Volume | 61 |
| DOIs | |
| Publication status | Published - 23 Sep 2013 |
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Keywords
- Crack
- Image processing
- Ultrasonic infrared thermography
- Vibrothermography
- Wavelet analysis
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
Cite this
Crack detection in aluminum parts by using ultrasound-excited infrared thermography. / Guo, Xingwang; Vavilov, Vladimir.
In: Infrared Physics and Technology, Vol. 61, 23.09.2013, p. 149-156.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Crack detection in aluminum parts by using ultrasound-excited infrared thermography
AU - Guo, Xingwang
AU - Vavilov, Vladimir
PY - 2013/9/23
Y1 - 2013/9/23
N2 - Ultrasound-stimulated IR thermography, thanks to its large-area imaging capability, high test productivity and safety, is a powerful tool for the inspection of cracks in heavy aluminum structures. In thick aluminum parts, the most important defect detection parameters are the differential temperature signal and signal-to-noise ratio (SNR), which typically reach their maximums at shortly (under 1 s) after the beginning of the ultrasonic excitation. In the IR inspection of non-metals, the ultrasonic excitation may be relatively long, while in the case of highly-conductive aluminum, short-pulse (burst) stimulation (from 0.4 to 1 s) is sufficient The crack detectability can be improved by evaluating temperature images at the times when maximum SNR values occur. Further enhancement of test results can be achieved by applying some data processing algorithms which can be 1D, i.e. applied to temperature evolutions in time, or 2D, i.e. applied to spatial coordinates, or a single image.
AB - Ultrasound-stimulated IR thermography, thanks to its large-area imaging capability, high test productivity and safety, is a powerful tool for the inspection of cracks in heavy aluminum structures. In thick aluminum parts, the most important defect detection parameters are the differential temperature signal and signal-to-noise ratio (SNR), which typically reach their maximums at shortly (under 1 s) after the beginning of the ultrasonic excitation. In the IR inspection of non-metals, the ultrasonic excitation may be relatively long, while in the case of highly-conductive aluminum, short-pulse (burst) stimulation (from 0.4 to 1 s) is sufficient The crack detectability can be improved by evaluating temperature images at the times when maximum SNR values occur. Further enhancement of test results can be achieved by applying some data processing algorithms which can be 1D, i.e. applied to temperature evolutions in time, or 2D, i.e. applied to spatial coordinates, or a single image.
KW - Crack
KW - Image processing
KW - Ultrasonic infrared thermography
KW - Vibrothermography
KW - Wavelet analysis
UR - http://www.scopus.com/inward/record.url?scp=84884254723&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84884254723&partnerID=8YFLogxK
U2 - 10.1016/j.infrared.2013.08.003
DO - 10.1016/j.infrared.2013.08.003
M3 - Article
AN - SCOPUS:84884254723
VL - 61
SP - 149
EP - 156
JO - Infrared Physics and Technology
JF - Infrared Physics and Technology
SN - 1350-4495
ER -