Abstract
It is shown that in terms of the representational theory the General Measurement Problem (GMP) can be treated as discrete optimization problem. Moreover, particular discrete optimization problems appear to every stage of the GMP solution. There is a sufficiently compact family of problems that is universal to a considerable extent. They permit to manage many concrete practical tasks appearing in the arrangement of the measurement process with both quantitative and qualitative scales. It is demonstrated that these universal problems are covering problems. Several variants of these problems are discussed in context of measurement with numerical examples. This approach allows also to consider from an integrated point of view any kind of functions of measurement information systems: the check, the diagnosis and the pattern recognition.
| Original language | English |
|---|---|
| Title of host publication | Conference Record - IEEE Instrumentation and Measurement Technology Conference |
| Place of Publication | Piscataway, NJ, United States |
| Publisher | IEEE |
| Pages | 1237-1242 |
| Number of pages | 6 |
| Volume | 2 |
| Publication status | Published - 1996 |
| Event | Proceedings of the Joint 1996 IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7. Vol 1 (of 2) - Brussels, Belgium Duration: 4 Jun 1996 → 6 Jun 1996 |
Other
| Other | Proceedings of the Joint 1996 IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7. Vol 1 (of 2) |
|---|---|
| City | Brussels, Belgium |
| Period | 4.6.96 → 6.6.96 |
Fingerprint
ASJC Scopus subject areas
- Instrumentation
Cite this
Covers in general measurement problem. / Muravyov, S. V.; Savolainen, V.
Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2 Piscataway, NJ, United States : IEEE, 1996. p. 1237-1242.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Covers in general measurement problem
AU - Muravyov, S. V.
AU - Savolainen, V.
PY - 1996
Y1 - 1996
N2 - It is shown that in terms of the representational theory the General Measurement Problem (GMP) can be treated as discrete optimization problem. Moreover, particular discrete optimization problems appear to every stage of the GMP solution. There is a sufficiently compact family of problems that is universal to a considerable extent. They permit to manage many concrete practical tasks appearing in the arrangement of the measurement process with both quantitative and qualitative scales. It is demonstrated that these universal problems are covering problems. Several variants of these problems are discussed in context of measurement with numerical examples. This approach allows also to consider from an integrated point of view any kind of functions of measurement information systems: the check, the diagnosis and the pattern recognition.
AB - It is shown that in terms of the representational theory the General Measurement Problem (GMP) can be treated as discrete optimization problem. Moreover, particular discrete optimization problems appear to every stage of the GMP solution. There is a sufficiently compact family of problems that is universal to a considerable extent. They permit to manage many concrete practical tasks appearing in the arrangement of the measurement process with both quantitative and qualitative scales. It is demonstrated that these universal problems are covering problems. Several variants of these problems are discussed in context of measurement with numerical examples. This approach allows also to consider from an integrated point of view any kind of functions of measurement information systems: the check, the diagnosis and the pattern recognition.
UR - http://www.scopus.com/inward/record.url?scp=0029722368&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0029722368&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:0029722368
VL - 2
SP - 1237
EP - 1242
BT - Conference Record - IEEE Instrumentation and Measurement Technology Conference
PB - IEEE
CY - Piscataway, NJ, United States
ER -