Covers in general measurement problem

S. V. Muravyov, V. Savolainen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

It is shown that in terms of the representational theory the General Measurement Problem (GMP) can be treated as discrete optimization problem. Moreover, particular discrete optimization problems appear to every stage of the GMP solution. There is a sufficiently compact family of problems that is universal to a considerable extent. They permit to manage many concrete practical tasks appearing in the arrangement of the measurement process with both quantitative and qualitative scales. It is demonstrated that these universal problems are covering problems. Several variants of these problems are discussed in context of measurement with numerical examples. This approach allows also to consider from an integrated point of view any kind of functions of measurement information systems: the check, the diagnosis and the pattern recognition.

Original languageEnglish
Title of host publicationConference Record - IEEE Instrumentation and Measurement Technology Conference
Place of PublicationPiscataway, NJ, United States
PublisherIEEE
Pages1237-1242
Number of pages6
Volume2
Publication statusPublished - 1996
EventProceedings of the Joint 1996 IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7. Vol 1 (of 2) - Brussels, Belgium
Duration: 4 Jun 19966 Jun 1996

Other

OtherProceedings of the Joint 1996 IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7. Vol 1 (of 2)
CityBrussels, Belgium
Period4.6.966.6.96

Fingerprint

optimization
information systems
pattern recognition
Pattern recognition
Information systems
coverings

ASJC Scopus subject areas

  • Instrumentation

Cite this

Muravyov, S. V., & Savolainen, V. (1996). Covers in general measurement problem. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (Vol. 2, pp. 1237-1242). Piscataway, NJ, United States: IEEE.

Covers in general measurement problem. / Muravyov, S. V.; Savolainen, V.

Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2 Piscataway, NJ, United States : IEEE, 1996. p. 1237-1242.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Muravyov, SV & Savolainen, V 1996, Covers in general measurement problem. in Conference Record - IEEE Instrumentation and Measurement Technology Conference. vol. 2, IEEE, Piscataway, NJ, United States, pp. 1237-1242, Proceedings of the Joint 1996 IEEE Instrumentation and Measurement Technology Conference & IMEKO Technical Committee 7. Vol 1 (of 2), Brussels, Belgium, 4.6.96.
Muravyov SV, Savolainen V. Covers in general measurement problem. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2. Piscataway, NJ, United States: IEEE. 1996. p. 1237-1242
Muravyov, S. V. ; Savolainen, V. / Covers in general measurement problem. Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2 Piscataway, NJ, United States : IEEE, 1996. pp. 1237-1242
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