Abstract
A near-field millimeter-wave (mm-wave) imaging system with a spatial resolution of less than 0.5 A has been designed in the millimeter wave range for on-line inspection of nonmetallic (dielectric) materials. The imaging system consists of a transceiver block coupled to an antenna that scans the material to be imaged; a reflector plate is placed behind the material. As an antenna a diffractive optics with focus F < λ is used. Such an antenna allow to focusing of millimeter-wave radiation beyond the Abbe barrier. A quadrature IF mixer in the transceiver block enables measurement of in-phase and quadrature-phase components of reflected signals with respect to the transmitted signal. The initial results show the feasibility of the near-field mm-wave sensor for nondestructive inspection of materials with subRayleigh resolution. Using future optically dense modified Fresnel lenses, a resolution of the order λ/100 seems to become possible.
| Original language | English |
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| Title of host publication | Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
| Pages | 509-512 |
| Number of pages | 4 |
| DOIs | |
| Publication status | Published - 2008 |
| Externally published | Yes |
| Event | 2008 China-Japan Joint Microwave Conference, CJMW 2008 - Shanghai, China Duration: 10 Sep 2008 → 12 Sep 2008 |
Conference
| Conference | 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
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| Country | China |
| City | Shanghai |
| Period | 10.9.08 → 12.9.08 |
Keywords
- Abbe barrier
- Fresnel lens
- Millimeter wave imaging system
- Nondestructive testing
- Sub-rayleigh resolution
ASJC Scopus subject areas
- Electrical and Electronic Engineering