Abstract
A near-field millimeter-wave (mm-wave) imaging system with a spatial resolution of less than 0.5 A has been designed in the millimeter wave range for on-line inspection of nonmetallic (dielectric) materials. The imaging system consists of a transceiver block coupled to an antenna that scans the material to be imaged; a reflector plate is placed behind the material. As an antenna a diffractive optics with focus F < λ is used. Such an antenna allow to focusing of millimeter-wave radiation beyond the Abbe barrier. A quadrature IF mixer in the transceiver block enables measurement of in-phase and quadrature-phase components of reflected signals with respect to the transmitted signal. The initial results show the feasibility of the near-field mm-wave sensor for nondestructive inspection of materials with subRayleigh resolution. Using future optically dense modified Fresnel lenses, a resolution of the order λ/100 seems to become possible.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
| Pages | 509-512 |
| Number of pages | 4 |
| DOIs | |
| Publication status | Published - 2008 |
| Externally published | Yes |
| Event | 2008 China-Japan Joint Microwave Conference, CJMW 2008 - Shanghai, China Duration: 10 Sep 2008 → 12 Sep 2008 |
Conference
| Conference | 2008 China-Japan Joint Microwave Conference, CJMW 2008 |
|---|---|
| Country | China |
| City | Shanghai |
| Period | 10.9.08 → 12.9.08 |
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Keywords
- Abbe barrier
- Fresnel lens
- Millimeter wave imaging system
- Nondestructive testing
- Sub-rayleigh resolution
ASJC Scopus subject areas
- Electrical and Electronic Engineering
Cite this
Concept of near-field millimeter-wave imaging system with a spatial resolution beyond the Abbe barrier. / Minin, I. V.; Minin, Oleg V.
Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008. 2008. p. 509-512 4772481.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Concept of near-field millimeter-wave imaging system with a spatial resolution beyond the Abbe barrier
AU - Minin, I. V.
AU - Minin, Oleg V.
PY - 2008
Y1 - 2008
N2 - A near-field millimeter-wave (mm-wave) imaging system with a spatial resolution of less than 0.5 A has been designed in the millimeter wave range for on-line inspection of nonmetallic (dielectric) materials. The imaging system consists of a transceiver block coupled to an antenna that scans the material to be imaged; a reflector plate is placed behind the material. As an antenna a diffractive optics with focus F < λ is used. Such an antenna allow to focusing of millimeter-wave radiation beyond the Abbe barrier. A quadrature IF mixer in the transceiver block enables measurement of in-phase and quadrature-phase components of reflected signals with respect to the transmitted signal. The initial results show the feasibility of the near-field mm-wave sensor for nondestructive inspection of materials with subRayleigh resolution. Using future optically dense modified Fresnel lenses, a resolution of the order λ/100 seems to become possible.
AB - A near-field millimeter-wave (mm-wave) imaging system with a spatial resolution of less than 0.5 A has been designed in the millimeter wave range for on-line inspection of nonmetallic (dielectric) materials. The imaging system consists of a transceiver block coupled to an antenna that scans the material to be imaged; a reflector plate is placed behind the material. As an antenna a diffractive optics with focus F < λ is used. Such an antenna allow to focusing of millimeter-wave radiation beyond the Abbe barrier. A quadrature IF mixer in the transceiver block enables measurement of in-phase and quadrature-phase components of reflected signals with respect to the transmitted signal. The initial results show the feasibility of the near-field mm-wave sensor for nondestructive inspection of materials with subRayleigh resolution. Using future optically dense modified Fresnel lenses, a resolution of the order λ/100 seems to become possible.
KW - Abbe barrier
KW - Fresnel lens
KW - Millimeter wave imaging system
KW - Nondestructive testing
KW - Sub-rayleigh resolution
UR - http://www.scopus.com/inward/record.url?scp=65949100633&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=65949100633&partnerID=8YFLogxK
U2 - 10.1109/CJMW.2008.4772481
DO - 10.1109/CJMW.2008.4772481
M3 - Conference contribution
SN - 9787811181630
SP - 509
EP - 512
BT - Proceedings of 2008 China-Japan Joint Microwave Conference, CJMW 2008
ER -