Abstract
This paper presents both hardware and software of a system for measurement of high-voltage signal with high resolution. The distinctive feature of the system is its application for investigation of the high-voltage plasma processes in solutions which are characterized by the pulse voltage within the range from 100 V to 3 kV and by the pulse duration from a few to hundreds microseconds. The system is portable and consists of the high-voltage dividers, signal level shift unit, oscilloscope, and computer with software. Structure and main principles of operation are described. Its technical and metrological parameters are given.
| Original language | English |
|---|---|
| Title of host publication | 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc. |
| Pages | 254-257 |
| Number of pages | 4 |
| Publication status | Published - 2008 |
| Event | 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session - Florence, Italy Duration: 22 Sep 2008 → 24 Sep 2008 |
Other
| Other | 16th IMEKO TC4 International Symposium on Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements; 13th International Workshop on ADC Modelling and Testing - IMEKO TC4 - TC21 Joint Session |
|---|---|
| Country | Italy |
| City | Florence |
| Period | 22.9.08 → 24.9.08 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
Fingerprint Dive into the research topics of 'Computer system for measurement of high voltage signal during plasma process in solution'. Together they form a unique fingerprint.
Cite this
Borikov, V. N. (2008). Computer system for measurement of high voltage signal during plasma process in solution. In 16th IMEKO TC4 Int. Symp.: Exploring New Frontiers of Instrum. and Methods for Electrical and Electronic Measurements; 13th TC21 Int. Workshop on ADC Modelling and Testing - Joint Session, Proc. (pp. 254-257)