Composition and properties of CeO2-SiO2 composite films prepared from film-forming solution

Abstract

This study focuses on the preparation and properties of CeO ₂-SiO₂ thin films with thickness ≤60 nm that can be used as protective coatings for solar cell panels and electrochromic counter electrodes. Thin-film CeO bsubesubbsubesub systems on glass and quartz substrates, which are manufactured from film-forming solutions based on cerium(III) nitrate, salicylic acid, and tetraethoxysilane and thermally treated, are mixtures of cerium(IV) (cubic modification) and silicon(IV) (amorphous phase) oxides. The films synthesized are distinguished by a net structure and high visible transmittance (∼90-100%). The morphology, phase composition, and optical properties of films were studied by X-ray diffraction, X-ray spectral microanalysis, scanning electron microscopy, spectrophotometry, and ellipsometry.

Original language	English
Pages (from-to)	913-917
Number of pages	5
Journal	Russian Journal of Inorganic Chemistry
Volume	59
Issue number	9
DOIs	https://doi.org/10.1134/S0036023614090083
Publication status	Published - 1 Jan 2014

ASJC Scopus subject areas

Inorganic Chemistry

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title = "Composition and properties of CeO2-SiO2 composite films prepared from film-forming solution",

abstract = "This study focuses on the preparation and properties of CeO 2-SiO2 thin films with thickness ≤60 nm that can be used as protective coatings for solar cell panels and electrochromic counter electrodes. Thin-film CeO bsubesubbsubesub systems on glass and quartz substrates, which are manufactured from film-forming solutions based on cerium(III) nitrate, salicylic acid, and tetraethoxysilane and thermally treated, are mixtures of cerium(IV) (cubic modification) and silicon(IV) (amorphous phase) oxides. The films synthesized are distinguished by a net structure and high visible transmittance (∼90-100%). The morphology, phase composition, and optical properties of films were studied by X-ray diffraction, X-ray spectral microanalysis, scanning electron microscopy, spectrophotometry, and ellipsometry.",

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Composition and properties of CeO₂-SiO₂ composite films prepared from film-forming solution

Abstract

ASJC Scopus subject areas

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