Abstract
The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.
| Original language | English |
|---|---|
| Title of host publication | IOP Conference Series: Materials Science and Engineering |
| Publisher | Institute of Physics Publishing |
| Volume | 93 |
| Edition | 1 |
| DOIs | |
| Publication status | Published - 13 Oct 2015 |
| Event | 21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015 - Tomsk, Russian Federation Duration: 5 Oct 2015 → 9 Oct 2015 |
Other
| Other | 21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015 |
|---|---|
| Country | Russian Federation |
| City | Tomsk |
| Period | 5.10.15 → 9.10.15 |
ASJC Scopus subject areas
- Engineering(all)
- Materials Science(all)
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Cite this
Miloichikova, I. A., Povolná, A., Stuchebrov, SG., & Naumenko, G. A. (2015). Comparison of the calculated and experimental data of the extracted electron beam profile. In IOP Conference Series: Materials Science and Engineering (1 ed., Vol. 93). [012067] Institute of Physics Publishing. https://doi.org/10.1088/1757-899X/93/1/012067