Comparison of the calculated and experimental data of the extracted electron beam profile

Abstract

The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.

Original language	English
Title of host publication	IOP Conference Series: Materials Science and Engineering
Publisher	Institute of Physics Publishing
Volume	93
Edition	1
DOIs	https://doi.org/10.1088/1757-899X/93/1/012067
Publication status	Published - 13 Oct 2015
Event	21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015 - Tomsk, Russian Federation Duration: 5 Oct 2015 → 9 Oct 2015

Other

Other	21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015
Country	Russian Federation
City	Tomsk
Period	5.10.15 → 9.10.15

ASJC Scopus subject areas

Engineering(all)
Materials Science(all)

Access to Document

10.1088/1757-899X/93/1/012067

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Comparison of the calculated and experimental data of the extracted electron beam profile. / Miloichikova, Irina Alekseevna; Povolná, A.; Stuchebrov, Sergei Gennadievich ; Naumenko, G. A.

IOP Conference Series: Materials Science and Engineering. Vol. 93 1. ed. Institute of Physics Publishing, 2015. 012067.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Miloichikova, IA, Povolná, A, Stuchebrov, SG & Naumenko, GA 2015, Comparison of the calculated and experimental data of the extracted electron beam profile. in IOP Conference Series: Materials Science and Engineering. 1 edn, vol. 93, 012067, Institute of Physics Publishing, 21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015, Tomsk, Russian Federation, 5.10.15. https://doi.org/10.1088/1757-899X/93/1/012067

@inproceedings{46aaa885704f4506ba6f816d34e339c8,

title = "Comparison of the calculated and experimental data of the extracted electron beam profile",

abstract = "The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program {"}Computer Laboratory (PCLab){"} is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.",

author = "Miloichikova, {Irina Alekseevna} and A. Povoln{\'a} and Sergei Gennadievich Stuchebrov and Naumenko, {G. A.}",

year = "2015",

month = oct,

day = "13",

doi = "10.1088/1757-899X/93/1/012067",

language = "English",

volume = "93",

booktitle = "IOP Conference Series: Materials Science and Engineering",

publisher = "Institute of Physics Publishing",

edition = "1",

note = "21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015 ; Conference date: 05-10-2015 Through 09-10-2015",

}

TY - GEN

T1 - Comparison of the calculated and experimental data of the extracted electron beam profile

AU - Miloichikova, Irina Alekseevna

AU - Povolná, A.

AU - Stuchebrov, Sergei Gennadievich

AU - Naumenko, G. A.

PY - 2015/10/13

Y1 - 2015/10/13

N2 - The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.

AB - The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.

UR - http://www.scopus.com/inward/record.url?scp=84947063187&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84947063187&partnerID=8YFLogxK

U2 - 10.1088/1757-899X/93/1/012067

DO - 10.1088/1757-899X/93/1/012067

M3 - Conference contribution

AN - SCOPUS:84947063187

VL - 93

BT - IOP Conference Series: Materials Science and Engineering

PB - Institute of Physics Publishing

T2 - 21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015

Y2 - 5 October 2015 through 9 October 2015

ER -