Comparison of the calculated and experimental data of the extracted electron beam profile

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.

Original languageEnglish
Title of host publicationIOP Conference Series: Materials Science and Engineering
PublisherInstitute of Physics Publishing
Volume93
Edition1
DOIs
Publication statusPublished - 13 Oct 2015
Event21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015 - Tomsk, Russian Federation
Duration: 5 Oct 20159 Oct 2015

Other

Other21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015
CountryRussian Federation
CityTomsk
Period5.10.159.10.15

Fingerprint

Electron beams
Particle accelerators
Computer program listings
Industry

ASJC Scopus subject areas

  • Engineering(all)
  • Materials Science(all)

Cite this

Miloichikova, I. A., Povolná, A., Stuchebrov, SG., & Naumenko, G. A. (2015). Comparison of the calculated and experimental data of the extracted electron beam profile. In IOP Conference Series: Materials Science and Engineering (1 ed., Vol. 93). [012067] Institute of Physics Publishing. https://doi.org/10.1088/1757-899X/93/1/012067

Comparison of the calculated and experimental data of the extracted electron beam profile. / Miloichikova, Irina Alekseevna; Povolná, A.; Stuchebrov, Sergei Gennadievich; Naumenko, G. A.

IOP Conference Series: Materials Science and Engineering. Vol. 93 1. ed. Institute of Physics Publishing, 2015. 012067.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Miloichikova, IA, Povolná, A, Stuchebrov, SG & Naumenko, GA 2015, Comparison of the calculated and experimental data of the extracted electron beam profile. in IOP Conference Series: Materials Science and Engineering. 1 edn, vol. 93, 012067, Institute of Physics Publishing, 21st International Conference for Students and Young Scientists: Modern Technique and Technologies, MTT 2015, Tomsk, Russian Federation, 5.10.15. https://doi.org/10.1088/1757-899X/93/1/012067
Miloichikova IA, Povolná A, Stuchebrov SG, Naumenko GA. Comparison of the calculated and experimental data of the extracted electron beam profile. In IOP Conference Series: Materials Science and Engineering. 1 ed. Vol. 93. Institute of Physics Publishing. 2015. 012067 https://doi.org/10.1088/1757-899X/93/1/012067
Miloichikova, Irina Alekseevna ; Povolná, A. ; Stuchebrov, Sergei Gennadievich ; Naumenko, G. A. / Comparison of the calculated and experimental data of the extracted electron beam profile. IOP Conference Series: Materials Science and Engineering. Vol. 93 1. ed. Institute of Physics Publishing, 2015.
@inproceedings{46aaa885704f4506ba6f816d34e339c8,
title = "Comparison of the calculated and experimental data of the extracted electron beam profile",
abstract = "The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program {"}Computer Laboratory (PCLab){"} is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.",
author = "Miloichikova, {Irina Alekseevna} and A. Povoln{\'a} and Sergei Gennadievich Stuchebrov and Naumenko, {G. A.}",
year = "2015",
month = "10",
day = "13",
doi = "10.1088/1757-899X/93/1/012067",
language = "English",
volume = "93",
booktitle = "IOP Conference Series: Materials Science and Engineering",
publisher = "Institute of Physics Publishing",
edition = "1",

}

TY - GEN

T1 - Comparison of the calculated and experimental data of the extracted electron beam profile

AU - Miloichikova, Irina Alekseevna

AU - Povolná, A.

AU - Stuchebrov, Sergei Gennadievich

AU - Naumenko, G. A.

PY - 2015/10/13

Y1 - 2015/10/13

N2 - The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.

AB - The current commercial use of electron accelerators grows in research, industry, medical diagnosis and treatment. Due to this fact, the creation of a model describing the electron beam profile and shape is an actual task. The model of the TPU microtron extracted electron beam created in the program "Computer Laboratory (PCLab)" is described and compared with experimental results in this article. The value of the internal electron beam divergence determination is illustrated. The experimental data of the electron beam profiles at the selected distances from the output window are analysed and compared with the simulation data. The simulation data of the electron beam profiles are shown.

UR - http://www.scopus.com/inward/record.url?scp=84947063187&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84947063187&partnerID=8YFLogxK

U2 - 10.1088/1757-899X/93/1/012067

DO - 10.1088/1757-899X/93/1/012067

M3 - Conference contribution

AN - SCOPUS:84947063187

VL - 93

BT - IOP Conference Series: Materials Science and Engineering

PB - Institute of Physics Publishing

ER -