Comparison of modeling switching losses of an IGBT based on the datasheet and an experimentation

Dounia Oustad, Stephane Lefebvre, Mickael Petit, Dominique Lhotellier, Menouar Ameziani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

This paper focuses on the prediction and the study of the veracity of a losses model (both conduction and switching losses) in IGBT power modules used for electric vehicle applications. This article shows a test case based on an experimental estimation of losses with a double pulse test circuit and a circuit model based on the use of ANSYS solver Circuit - Simplorer

Original languageEnglish
Title of host publication2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9789075815245
DOIs
Publication statusPublished - 25 Oct 2016
Externally publishedYes
Event18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe - Karlsruhe, Germany
Duration: 5 Sep 20169 Sep 2016

Publication series

Name2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe

Conference

Conference18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe
CountryGermany
CityKarlsruhe
Period5.9.169.9.16

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Keywords

  • device characterization
  • device model
  • efficiency
  • electric vehicle
  • IGBT
  • switching losses
  • voltage source inverter

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Oustad, D., Lefebvre, S., Petit, M., Lhotellier, D., & Ameziani, M. (2016). Comparison of modeling switching losses of an IGBT based on the datasheet and an experimentation. In 2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe [7695494] (2016 18th European Conference on Power Electronics and Applications, EPE 2016 ECCE Europe). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPE.2016.7695494