Compact metal probes

A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

R. D. Rodriguez, E. Sheremet, S. Müller, O. D. Gordan, A. Villabona, S. Schulze, M. Hietschold, D. R.T. Zahn

Research output: Contribution to journalArticle

26 Citations (Scopus)

Abstract

There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

Original languageEnglish
Article number123708
JournalReview of Scientific Instruments
Volume83
Issue number12
DOIs
Publication statusPublished - 1 Dec 2012
Externally publishedYes

Fingerprint

Raman spectroscopy
Atomic force microscopy
atomic force microscopy
probes
Metals
metals
Microscopes
Silicon
Experiments
Silicon nitride
Silver
Tuning
microscopes
Scanning
Coatings
forks
Geometry
silicon
Chemical analysis
silicon nitrides

ASJC Scopus subject areas

  • Instrumentation

Cite this

Compact metal probes : A solution for atomic force microscopy based tip-enhanced Raman spectroscopy. / Rodriguez, R. D.; Sheremet, E.; Müller, S.; Gordan, O. D.; Villabona, A.; Schulze, S.; Hietschold, M.; Zahn, D. R.T.

In: Review of Scientific Instruments, Vol. 83, No. 12, 123708, 01.12.2012.

Research output: Contribution to journalArticle

Rodriguez, R. D. ; Sheremet, E. ; Müller, S. ; Gordan, O. D. ; Villabona, A. ; Schulze, S. ; Hietschold, M. ; Zahn, D. R.T. / Compact metal probes : A solution for atomic force microscopy based tip-enhanced Raman spectroscopy. In: Review of Scientific Instruments. 2012 ; Vol. 83, No. 12.
@article{a5c80b9a360f4fb2b308d4081501dea6,
title = "Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy",
abstract = "There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.",
author = "Rodriguez, {R. D.} and E. Sheremet and S. M{\"u}ller and Gordan, {O. D.} and A. Villabona and S. Schulze and M. Hietschold and Zahn, {D. R.T.}",
year = "2012",
month = "12",
day = "1",
doi = "10.1063/1.4770140",
language = "English",
volume = "83",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "12",

}

TY - JOUR

T1 - Compact metal probes

T2 - A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

AU - Rodriguez, R. D.

AU - Sheremet, E.

AU - Müller, S.

AU - Gordan, O. D.

AU - Villabona, A.

AU - Schulze, S.

AU - Hietschold, M.

AU - Zahn, D. R.T.

PY - 2012/12/1

Y1 - 2012/12/1

N2 - There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

AB - There are many challenges in accomplishing tip-enhanced Raman spectroscopy (TERS) and obtaining a proper tip is probably the greatest one. Since tip size, composition, and geometry are the ultimate parameters that determine enhancement of intensity and lateral resolution, the tip becomes the most critical component in a TERS experiment. However, since the discovery of TERS the cantilevers used in atomic force microscopy (AFM) have remained basically the same: commercial silicon (or silicon nitride) tips covered by a metallic coating. The main issues of using metal-coated silicon cantilevers, such as wearing off of the metal layer or increased tip radius, can be completely overcome by using all-metal cantilevers. Until now in TERS experiments such probes have only been used in a scanning tunneling microscope or in a tuning fork-based shear force microscope but not in AFM. In this work for the first time, we show the use of compact silver cantilevers that are fully compatible with contact and tapping modes in AFM demonstrating their superb performance in TERS experiments.

UR - http://www.scopus.com/inward/record.url?scp=84875476635&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84875476635&partnerID=8YFLogxK

U2 - 10.1063/1.4770140

DO - 10.1063/1.4770140

M3 - Article

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 12

M1 - 123708

ER -