Combined device for vacuum electron diode adjustment

Research output: Contribution to journalArticle

Abstract

The article describes a principle, design and test results of a device for simultaneous capture of electron beam current ejected through an anode and optical image of a cathode surface. The device was tested on “ASTRA-M” pulsed electron accelerator (TPU, Russia) with the following parameters: 300 kV, 0.6 kA and beam current duration of 150 ns (FWHM). Light emission points have been registered for several individual emitters of the tested cathode. CMOS optical sensor of the device provides PC compatibility and detection of disturbances in the cathode or vacuum diode operation for single pulses and in burst mode. The efficiency of electron beam current ejection can be also estimated during vacuum diode adjustment. Detailed cathode images captured by photographic film include both frontal and angle (circular) projections of the cathode surface and can be used to study processes in the accelerating gap.

Original languageEnglish
Pages (from-to)10-14
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume911
DOIs
Publication statusPublished - 11 Dec 2018

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Diodes
Cathodes
cathodes
adjusting
diodes
Vacuum
vacuum
beam currents
Electrons
electrons
Electron beams
electron beams
photographic film
Photographic films
electron accelerators
Light emission
Optical sensors
optical measuring instruments
Russian Federation
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Keywords

  • Accelerating gap
  • Cathode surface
  • Electron beam
  • Electron beam current
  • Emission surface
  • Vacuum electron diode

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

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abstract = "The article describes a principle, design and test results of a device for simultaneous capture of electron beam current ejected through an anode and optical image of a cathode surface. The device was tested on “ASTRA-M” pulsed electron accelerator (TPU, Russia) with the following parameters: 300 kV, 0.6 kA and beam current duration of 150 ns (FWHM). Light emission points have been registered for several individual emitters of the tested cathode. CMOS optical sensor of the device provides PC compatibility and detection of disturbances in the cathode or vacuum diode operation for single pulses and in burst mode. The efficiency of electron beam current ejection can be also estimated during vacuum diode adjustment. Detailed cathode images captured by photographic film include both frontal and angle (circular) projections of the cathode surface and can be used to study processes in the accelerating gap.",
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AB - The article describes a principle, design and test results of a device for simultaneous capture of electron beam current ejected through an anode and optical image of a cathode surface. The device was tested on “ASTRA-M” pulsed electron accelerator (TPU, Russia) with the following parameters: 300 kV, 0.6 kA and beam current duration of 150 ns (FWHM). Light emission points have been registered for several individual emitters of the tested cathode. CMOS optical sensor of the device provides PC compatibility and detection of disturbances in the cathode or vacuum diode operation for single pulses and in burst mode. The efficiency of electron beam current ejection can be also estimated during vacuum diode adjustment. Detailed cathode images captured by photographic film include both frontal and angle (circular) projections of the cathode surface and can be used to study processes in the accelerating gap.

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