Coherent radiation recoil effect for the optical diffraction radiation beam size monitor at SLAC FFTB

A. Potylitsyn, G. Naumenko, A. Aryshev, Y. Fukui, D. Cline, F. Zhou, M. Ross, P. Bolton, J. Urakawa, T. Muto, M. Tobiyama, R. Hamatsu, Pavel Vladimirovich Karataev

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A short electron bunch with length σ passing through a slit in the diffraction radiation (DR) target generates radiation with a broad spectrum. Optical part of the spectrum (incoherent radiation) may be used for beam size measurements, but in the wavelength range λ ≥ σ radiation becomes coherent. The coherent DR spectrum per each electron in a bunch is equal to single electron spectrum times by the number of electrons in a bunch N e and bunch form factor. For SLAC FFTB conditions (Ne ∼ 1010, σ = 0.7 mm, outer target size R ∼ 10 mm, slit width h ∼ 0.1 mm) we approximated coherent DR (CDR) spectrum by coherent transition radiation (TR) one because in the wavelength region λ ∼ σ ≫ h TR and DR spectra coincide with high accuracy. Changing the DR target by a TR target with projection on the plane perpendicular to electron beam as a circle with radius R ≤ 20 mm we calculated CDR spectra using simple model. Knowing the CDR spectrum we estimated the energy CDR emitting by each electron in the perpendicular direction (due to target inclination angle 45°). It means an electron receives the radiation recoil in this direction. In other words, electron has a transverse kick about 1 μrad that may be considered as permissible. Published by Elsevier B.V.

Original languageEnglish
Pages (from-to)170-174
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume227
Issue number1-2
DOIs
Publication statusPublished - Jan 2005

Keywords

  • Coherent radiation
  • Diagnostics
  • Diffraction radiation
  • Electron beams

ASJC Scopus subject areas

  • Surfaces, Coatings and Films
  • Instrumentation
  • Surfaces and Interfaces

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