Abstract
The promising approach to measure a length of subpicosecond electron bunch is connected with measurements of coherent diffraction radiation (CDR) spectra due to strong dependence of the spectrum shape on the bunch length σz in the wavelength region λ ∼ σz [Proceedings of the International Symposium on New Visions in Laser-Beam Interactions, Nucl. Instr. and Meth. A 455 (1) (2000)]. The spectral measurements may be carried out by using an interferometer or a polychromator. The alternative approach for similar measurements is proposed in the paper. The interference pattern from two shifted halves of a CDR target may be used for this aim. If the broadband detector measures a CDR yield around λ0 ∼ σz then moving one half of the CDR target relative to other (parallel to beam) in the range of a few bunch lengths one can obtain the detuning curve (interferogram). The shape of detuning curve and its connection with bunch length is calculated for different detector apertures and detector waveband. The proposed technique may open the new possibility for non-invasive bunch length measurements in the subpico-second range.
| Original language | English |
|---|---|
| Pages (from-to) | 191-197 |
| Number of pages | 7 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 227 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - Jan 2005 |
Fingerprint
Keywords
- Diffraction radiation
- Electron beam diagnostics
ASJC Scopus subject areas
- Surfaces, Coatings and Films
- Instrumentation
- Surfaces and Interfaces
Cite this
Coherent diffraction radiation interferometry and short bunch length measurements. / Potylitsyn, A. P.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 227, No. 1-2, 01.2005, p. 191-197.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Coherent diffraction radiation interferometry and short bunch length measurements
AU - Potylitsyn, A. P.
PY - 2005/1
Y1 - 2005/1
N2 - The promising approach to measure a length of subpicosecond electron bunch is connected with measurements of coherent diffraction radiation (CDR) spectra due to strong dependence of the spectrum shape on the bunch length σz in the wavelength region λ ∼ σz [Proceedings of the International Symposium on New Visions in Laser-Beam Interactions, Nucl. Instr. and Meth. A 455 (1) (2000)]. The spectral measurements may be carried out by using an interferometer or a polychromator. The alternative approach for similar measurements is proposed in the paper. The interference pattern from two shifted halves of a CDR target may be used for this aim. If the broadband detector measures a CDR yield around λ0 ∼ σz then moving one half of the CDR target relative to other (parallel to beam) in the range of a few bunch lengths one can obtain the detuning curve (interferogram). The shape of detuning curve and its connection with bunch length is calculated for different detector apertures and detector waveband. The proposed technique may open the new possibility for non-invasive bunch length measurements in the subpico-second range.
AB - The promising approach to measure a length of subpicosecond electron bunch is connected with measurements of coherent diffraction radiation (CDR) spectra due to strong dependence of the spectrum shape on the bunch length σz in the wavelength region λ ∼ σz [Proceedings of the International Symposium on New Visions in Laser-Beam Interactions, Nucl. Instr. and Meth. A 455 (1) (2000)]. The spectral measurements may be carried out by using an interferometer or a polychromator. The alternative approach for similar measurements is proposed in the paper. The interference pattern from two shifted halves of a CDR target may be used for this aim. If the broadband detector measures a CDR yield around λ0 ∼ σz then moving one half of the CDR target relative to other (parallel to beam) in the range of a few bunch lengths one can obtain the detuning curve (interferogram). The shape of detuning curve and its connection with bunch length is calculated for different detector apertures and detector waveband. The proposed technique may open the new possibility for non-invasive bunch length measurements in the subpico-second range.
KW - Diffraction radiation
KW - Electron beam diagnostics
UR - http://www.scopus.com/inward/record.url?scp=9944262855&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=9944262855&partnerID=8YFLogxK
U2 - 10.1016/j.nimb.2004.06.017
DO - 10.1016/j.nimb.2004.06.017
M3 - Article
AN - SCOPUS:9944262855
VL - 227
SP - 191
EP - 197
JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
SN - 0168-583X
IS - 1-2
ER -