Circuit simulations of a 1 MV LTD for radiography

J. Leckbee, J. Maenchen, S. Portillo, S. Cordova, I. Molina, D. L. Johnson, D. V. Rose, A. A. Kim, R. Chavez, D. Ziska

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)

    Abstract

    A 1 MV Linear Transformer Driver (LTD), capable of driving a radiographic diode load, has been built and tested. A circuit model of this accelerator has been developed using the BERTHA circuit simulation code. Simulations are compared to data from power-flow experiments utilizing a large area electron-beam diode load. Results show that the simulation model performs well in modeling the baseline operation of the accelerator. In addition, the circuit model has been used to predict several possible fault modes. Simulations of switch prefires, main capacitor failure, vacuum insulator flashover, and core saturation have been used to estimate the probability of inducing further failures and the impact on the load voltage and current.

    Original languageEnglish
    Title of host publicationDigest of Technical Papers-IEEE International Pulsed Power Conference
    Pages386-389
    Number of pages4
    DOIs
    Publication statusPublished - 2007
    Event2005 IEEE Pulsed Power Conference, PPC - Monterey, CA, United States
    Duration: 13 Jun 200517 Jun 2005

    Other

    Other2005 IEEE Pulsed Power Conference, PPC
    CountryUnited States
    CityMonterey, CA
    Period13.6.0517.6.05

    Fingerprint

    Radiography
    Circuit simulation
    Particle accelerators
    Diodes
    Flashover
    Networks (circuits)
    Electron beams
    Capacitors
    Switches
    Vacuum
    Electric potential
    Experiments

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Leckbee, J., Maenchen, J., Portillo, S., Cordova, S., Molina, I., Johnson, D. L., ... Ziska, D. (2007). Circuit simulations of a 1 MV LTD for radiography. In Digest of Technical Papers-IEEE International Pulsed Power Conference (pp. 386-389). [4084233] https://doi.org/10.1109/PPC.2005.300656

    Circuit simulations of a 1 MV LTD for radiography. / Leckbee, J.; Maenchen, J.; Portillo, S.; Cordova, S.; Molina, I.; Johnson, D. L.; Rose, D. V.; Kim, A. A.; Chavez, R.; Ziska, D.

    Digest of Technical Papers-IEEE International Pulsed Power Conference. 2007. p. 386-389 4084233.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Leckbee, J, Maenchen, J, Portillo, S, Cordova, S, Molina, I, Johnson, DL, Rose, DV, Kim, AA, Chavez, R & Ziska, D 2007, Circuit simulations of a 1 MV LTD for radiography. in Digest of Technical Papers-IEEE International Pulsed Power Conference., 4084233, pp. 386-389, 2005 IEEE Pulsed Power Conference, PPC, Monterey, CA, United States, 13.6.05. https://doi.org/10.1109/PPC.2005.300656
    Leckbee J, Maenchen J, Portillo S, Cordova S, Molina I, Johnson DL et al. Circuit simulations of a 1 MV LTD for radiography. In Digest of Technical Papers-IEEE International Pulsed Power Conference. 2007. p. 386-389. 4084233 https://doi.org/10.1109/PPC.2005.300656
    Leckbee, J. ; Maenchen, J. ; Portillo, S. ; Cordova, S. ; Molina, I. ; Johnson, D. L. ; Rose, D. V. ; Kim, A. A. ; Chavez, R. ; Ziska, D. / Circuit simulations of a 1 MV LTD for radiography. Digest of Technical Papers-IEEE International Pulsed Power Conference. 2007. pp. 386-389
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    abstract = "A 1 MV Linear Transformer Driver (LTD), capable of driving a radiographic diode load, has been built and tested. A circuit model of this accelerator has been developed using the BERTHA circuit simulation code. Simulations are compared to data from power-flow experiments utilizing a large area electron-beam diode load. Results show that the simulation model performs well in modeling the baseline operation of the accelerator. In addition, the circuit model has been used to predict several possible fault modes. Simulations of switch prefires, main capacitor failure, vacuum insulator flashover, and core saturation have been used to estimate the probability of inducing further failures and the impact on the load voltage and current.",
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