Charge electrification of irradiated dielectrics and its effect on incident flux

V. A. Starodubtsev, T. V. Fursa, N. N. Zausaeva

Research output: Contribution to journalArticle

Abstract

An experimental investigation was performed on the stopping of charge injection in dielectrics irradiated by mid-energy electron flux. For relatively thick layers of LiF, PMMA, fused SiO2 and phosphate glass the phenomenon of annular current channel formation was observed when the electron beam had an energy below 0.1 MeV. A simple model of beam spreading is developed and the limiting conditions are established for the effect described.

Original languageEnglish
Pages (from-to)341-347
Number of pages7
JournalJournal of Electrostatics
Volume20
Issue number3
DOIs
Publication statusPublished - 1988

Fingerprint

electrification
Charge injection
Polymethyl Methacrylate
Electron beams
Phosphates
Electrons
Fluxes
Glass
electron flux
stopping
phosphates
electron beams
injection
Injections
energy
glass
poly(methyl methacrylate-silicon dioxide)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Materials Chemistry
  • Physics and Astronomy(all)
  • Surfaces and Interfaces

Cite this

Charge electrification of irradiated dielectrics and its effect on incident flux. / Starodubtsev, V. A.; Fursa, T. V.; Zausaeva, N. N.

In: Journal of Electrostatics, Vol. 20, No. 3, 1988, p. 341-347.

Research output: Contribution to journalArticle

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