Characterization of Ti-Al surface alloy formed by pulsed electron-beam melting of film-substrate system

N. Allain-Bonasso, V. P. Rotshtein, E. Bouzy, L. Germain, Yu F. Ivanov, T. Grosdidier

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

This paper presents our first results of an ongoing research dedicated to the analysis of Ti-Al surface alloy obtained by a new duplex e-beam treatment. The crack-free Ti3Al-based surface alloy was synthesized by cyclic pulsed melting/mixing of pre-deposited Al film (100nm) on Ti substrate with a low-energy (10-20keV) high-current electron beam (3μs, 3.5J/cm2) followed by additional pulsed e-beam melting (100μs, 15keV, 15J/cm 2). The surface analysis has revealed the complexity of the local transformation paths associated with this synthesis mode. A fairly good surface chemical homogeneity was obtained but a duplex microstructures formed because of local changes in the primary phase under rapid solidification and the subsequent modifications of the solid state transformation paths.

Original languageEnglish
Article number012007
JournalJournal of Physics: Conference Series
Volume416
Issue number1
DOIs
Publication statusPublished - 2013

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melting
electron beams
rapid solidification
homogeneity
high current
cracks
solid state
microstructure
synthesis
energy

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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Characterization of Ti-Al surface alloy formed by pulsed electron-beam melting of film-substrate system. / Allain-Bonasso, N.; Rotshtein, V. P.; Bouzy, E.; Germain, L.; Ivanov, Yu F.; Grosdidier, T.

In: Journal of Physics: Conference Series, Vol. 416, No. 1, 012007, 2013.

Research output: Contribution to journalArticle

Allain-Bonasso, N. ; Rotshtein, V. P. ; Bouzy, E. ; Germain, L. ; Ivanov, Yu F. ; Grosdidier, T. / Characterization of Ti-Al surface alloy formed by pulsed electron-beam melting of film-substrate system. In: Journal of Physics: Conference Series. 2013 ; Vol. 416, No. 1.
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