The paper is focused on the surface characterization of pristine and modified solid materials (polymer, glass) by atomic force microscopy. For selected materials its comparison with laser confocal microscopy is introduced. The studied surfaces were modified either with argon plasma or laser beam scanning. Two approaches of polymer surface nanostructuring by laser beam exposure are discussed: (i) exposure of surface with polarized excimer laser beam and (ii) scanning of doped polymer surface by semiconductor laser. The influence of laser fluence, angle of laser beam incidence and laser beam wavelength on the nanostructure formation studied with atomic force microscopy is described. The deposition of metal nanolayers on biopolymer substrates and the influence of heating of such system on it surface morphology and roughness were studied both by contact and tapping mode of AFM and also compared with the analysis by laser confocal microscopy. Nanostructured polymers with plasma were consequently used as substrates for Au nanolayers deposition or metal nanoparticle grafting. The metal nanolayers or grafted nanoparticles were determined by AFM. On such samples the "biocompatibility" study was performed. The increase of polymer's biocompatibility was determined in the dependence on surface morphology, roughness and chemical structure. An atomic force microscopy was applied for the surface structure determination and optical microscopy was applied for cell distribution study. Polymer films doped with porphyrin were irradiated with laser and simultaneously mechanically scanned. By combination of these two techniques (laser scanning and doping) the regular periodic pattern was formed. The structure properties of such structures were studied with atomic force microscopy, the dependence of pattern parameters on scanning velocity and laser intensity was determined. Nanostructured polymer surfaces are perspective substrates for electronics, optics and tissue engineering. The atomic force microscopy was proved to be a powerful tool for its surface characterization and can be successfully complemented with laser confocal microscopy and optical microscopy.
|Title of host publication||Atomic Force Microscopy (AFM)|
|Subtitle of host publication||Principles, Modes of Operation and Limitations|
|Publisher||Nova Science Publishers, Inc.|
|Number of pages||70|
|Publication status||Published - 1 Apr 2014|
ASJC Scopus subject areas