Change of electron injection in irradiated dielectrics caused by surface charging

Abstract

The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

Original language	English
Pages (from-to)	37-43
Number of pages	7
Journal	Journal of Electrostatics
Volume	21
Issue number	1
DOIs	https://doi.org/10.1016/0304-3886(88)90017-4
Publication status	Published - 1988

ASJC Scopus subject areas

Electrical and Electronic Engineering
Materials Science(all)
Materials Chemistry
Physics and Astronomy(all)
Surfaces and Interfaces

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10.1016/0304-3886(88)90017-4

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Starodubtsev, V. A., Fursa, T. V., & Erofeeva, GV. (1988). Change of electron injection in irradiated dielectrics caused by surface charging. Journal of Electrostatics, 21(1), 37-43. https://doi.org/10.1016/0304-3886(88)90017-4

@article{b78e8f05bad74ec9aa80bd6e19b51747,

title = "Change of electron injection in irradiated dielectrics caused by surface charging",

abstract = "The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.",

author = "Starodubtsev, {V. A.} and Fursa, {T. V.} and Galina Vasilievna Erofeeva",

year = "1988",

doi = "10.1016/0304-3886(88)90017-4",

language = "English",

volume = "21",

pages = "37--43",

journal = "Journal of Electrostatics",

issn = "0304-3886",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - Change of electron injection in irradiated dielectrics caused by surface charging

AU - Starodubtsev, V. A.

AU - Fursa, T. V.

AU - Erofeeva, Galina Vasilievna

PY - 1988

Y1 - 1988

N2 - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

AB - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

UR - http://www.scopus.com/inward/record.url?scp=0024053655&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024053655&partnerID=8YFLogxK

U2 - 10.1016/0304-3886(88)90017-4

DO - 10.1016/0304-3886(88)90017-4

M3 - Article

AN - SCOPUS:0024053655

VL - 21

SP - 37

EP - 43

JO - Journal of Electrostatics

JF - Journal of Electrostatics

SN - 0304-3886

IS - 1

ER -