Abstract
The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.
| Original language | English |
|---|---|
| Pages (from-to) | 37-43 |
| Number of pages | 7 |
| Journal | Journal of Electrostatics |
| Volume | 21 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1988 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Materials Science(all)
- Materials Chemistry
- Physics and Astronomy(all)
- Surfaces and Interfaces
Cite this
Change of electron injection in irradiated dielectrics caused by surface charging. / Starodubtsev, V. A.; Fursa, T. V.; Erofeeva, Galina Vasilievna.
In: Journal of Electrostatics, Vol. 21, No. 1, 1988, p. 37-43.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Change of electron injection in irradiated dielectrics caused by surface charging
AU - Starodubtsev, V. A.
AU - Fursa, T. V.
AU - Erofeeva, Galina Vasilievna
PY - 1988
Y1 - 1988
N2 - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.
AB - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.
UR - http://www.scopus.com/inward/record.url?scp=0024053655&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0024053655&partnerID=8YFLogxK
U2 - 10.1016/0304-3886(88)90017-4
DO - 10.1016/0304-3886(88)90017-4
M3 - Article
AN - SCOPUS:0024053655
VL - 21
SP - 37
EP - 43
JO - Journal of Electrostatics
JF - Journal of Electrostatics
SN - 0304-3886
IS - 1
ER -