Change of electron injection in irradiated dielectrics caused by surface charging

Research output: Contribution to journalArticle

Abstract

The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

Original languageEnglish
Pages (from-to)37-43
Number of pages7
JournalJournal of Electrostatics
Volume21
Issue number1
DOIs
Publication statusPublished - 1988

Fingerprint

Electron injection
charging
Electron beams
electron beams
Electrons
injection
Injections
Beam plasma interactions
Computer Simulation
electrons
computerized simulation
Electric fields
Trajectories
trajectories
Scattering
electric fields
causes
Computer simulation
scattering
interactions

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)
  • Materials Chemistry
  • Physics and Astronomy(all)
  • Surfaces and Interfaces

Cite this

Change of electron injection in irradiated dielectrics caused by surface charging. / Starodubtsev, V. A.; Fursa, T. V.; Erofeeva, Galina Vasilievna.

In: Journal of Electrostatics, Vol. 21, No. 1, 1988, p. 37-43.

Research output: Contribution to journalArticle

@article{b78e8f05bad74ec9aa80bd6e19b51747,
title = "Change of electron injection in irradiated dielectrics caused by surface charging",
abstract = "The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.",
author = "Starodubtsev, {V. A.} and Fursa, {T. V.} and Galina Vasilievna Erofeeva",
year = "1988",
doi = "10.1016/0304-3886(88)90017-4",
language = "English",
volume = "21",
pages = "37--43",
journal = "Journal of Electrostatics",
issn = "0304-3886",
publisher = "Elsevier",
number = "1",

}

TY - JOUR

T1 - Change of electron injection in irradiated dielectrics caused by surface charging

AU - Starodubtsev, V. A.

AU - Fursa, T. V.

AU - Erofeeva, Galina Vasilievna

PY - 1988

Y1 - 1988

N2 - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

AB - The large electric field generated by the charged surface of a dielectric irradiated with a mid-energy, finite-width electron beam is considered as a cause of beam spreading. The quasi-static modeling of interaction between the electron beam and the charged surface is described. The computer simulation of this process shows a focussing effect for the peripheric trajectories along with back scattering for the central part of the beam. A good qualitative agreement with the experimental data is noted.

UR - http://www.scopus.com/inward/record.url?scp=0024053655&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0024053655&partnerID=8YFLogxK

U2 - 10.1016/0304-3886(88)90017-4

DO - 10.1016/0304-3886(88)90017-4

M3 - Article

VL - 21

SP - 37

EP - 43

JO - Journal of Electrostatics

JF - Journal of Electrostatics

SN - 0304-3886

IS - 1

ER -