Abstract
An analytical solution was obtained for the unidimensional problem of thermal inspection for a defect with arbitrary thermophysical properties and thickness. Part of the table for calculating the sensitivity of inspection is presented; the table links, in the dimensionless form, the parameters of the temperature field. An example of calculations is given.
Original language | English |
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Pages (from-to) | 422-428 |
Number of pages | 7 |
Journal | The Soviet journal of nondestructive testing |
Volume | 22 |
Issue number | 6 |
Publication status | Published - Jun 1986 |
ASJC Scopus subject areas
- Engineering(all)