An analytical solution was obtained for the unidimensional problem of thermal inspection for a defect with arbitrary thermophysical properties and thickness. Part of the table for calculating the sensitivity of inspection is presented; the table links, in the dimensionless form, the parameters of the temperature field. An example of calculations is given.
|Number of pages||7|
|Journal||The Soviet journal of nondestructive testing|
|Publication status||Published - Jun 1986|
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