Breakdown strength of two-layer dielectrics

S. M. Lebedev, O. S. Gefle, Yu P. Pokholkov, V. I. Chichikin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)


In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. We suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

Original languageEnglish
Title of host publicationIEE Conference Publication
Place of PublicationStevenage, United Kingdom
ISBN (Print)0852967195
Publication statusPublished - 1999
EventProceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99) - London, UK
Duration: 23 Aug 199927 Aug 1999


OtherProceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99)
CityLondon, UK

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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