Breakdown strength of two-layer dielectrics

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. We suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

Original languageEnglish
Title of host publicationIEE Conference Publication
Place of PublicationStevenage, United Kingdom
PublisherIEE
Volume4
Edition467
ISBN (Print)0852967195
Publication statusPublished - 1999
EventProceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99) - London, UK
Duration: 23 Aug 199927 Aug 1999

Other

OtherProceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99)
CityLondon, UK
Period23.8.9927.8.99

Fingerprint

Permittivity
Electric fields
Polarization

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Lebedev, S. M., Gefle, O. S., Pokholkov, Y. P., & Chichikin, V. I. (1999). Breakdown strength of two-layer dielectrics. In IEE Conference Publication (467 ed., Vol. 4). Stevenage, United Kingdom: IEE.

Breakdown strength of two-layer dielectrics. / Lebedev, S. M.; Gefle, O. S.; Pokholkov, Yu P.; Chichikin, V. I.

IEE Conference Publication. Vol. 4 467. ed. Stevenage, United Kingdom : IEE, 1999.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lebedev, SM, Gefle, OS, Pokholkov, YP & Chichikin, VI 1999, Breakdown strength of two-layer dielectrics. in IEE Conference Publication. 467 edn, vol. 4, IEE, Stevenage, United Kingdom, Proceedings of the 1999 11th International Symposium on 'High Voltage Engineering' (ish99), London, UK, 23.8.99.
Lebedev SM, Gefle OS, Pokholkov YP, Chichikin VI. Breakdown strength of two-layer dielectrics. In IEE Conference Publication. 467 ed. Vol. 4. Stevenage, United Kingdom: IEE. 1999
Lebedev, S. M. ; Gefle, O. S. ; Pokholkov, Yu P. ; Chichikin, V. I. / Breakdown strength of two-layer dielectrics. IEE Conference Publication. Vol. 4 467. ed. Stevenage, United Kingdom : IEE, 1999.
@inproceedings{b2347de3b6fc43a2a20b526486a196f5,
title = "Breakdown strength of two-layer dielectrics",
abstract = "In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. We suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.",
author = "Lebedev, {S. M.} and Gefle, {O. S.} and Pokholkov, {Yu P.} and Chichikin, {V. I.}",
year = "1999",
language = "English",
isbn = "0852967195",
volume = "4",
booktitle = "IEE Conference Publication",
publisher = "IEE",
edition = "467",

}

TY - GEN

T1 - Breakdown strength of two-layer dielectrics

AU - Lebedev, S. M.

AU - Gefle, O. S.

AU - Pokholkov, Yu P.

AU - Chichikin, V. I.

PY - 1999

Y1 - 1999

N2 - In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. We suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

AB - In paper the experimental results of the breakdown strength study for the two-layer dielectrics under the high electric field are given. The relation between the breakdown strength (Eb) and the boundary position (ξ) between layers for the two-layer dielectrics is anomalous in character. Similar results for the dissipation factor tanδ in low and high field were obtained. We suppose that the discovered changes in Eb and tanδ with the changing ξ are probably caused by the forming peculiarities of the relaxation polarization due to the existence of abrupt step in both the permittivity and conductivity at the boundary between dielectric layers.

UR - http://www.scopus.com/inward/record.url?scp=17144435353&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=17144435353&partnerID=8YFLogxK

M3 - Conference contribution

SN - 0852967195

VL - 4

BT - IEE Conference Publication

PB - IEE

CY - Stevenage, United Kingdom

ER -