Behaviour of multilayer PET polymer film insulation in high electric fields

O. S. Gefle, S. M. Lebedev, Y. P. Pokholkov, I. Vitellas, D. P. Agoris

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Experimental results of breakdown voltage, tanδ and the parameters of partial discharges for multilayer Polyfilm insulation are presented. It is shown that the breakdown voltage of multilayer film insulation may be increased approximately by 70% compared with single-layer insulation of the same thickness due to the correct choice of the films' thickness. It is established that this increase in the breakdown voltage is associated with the increase of the ignition voltage of critical partial discharges.

Original languageEnglish
Pages (from-to)273-277
Number of pages5
JournalIEE Proceedings: Science, Measurement and Technology
Volume151
Issue number4
DOIs
Publication statusPublished - Jul 2004

Fingerprint

Electric breakdown
Polymer films
Insulation
Multilayers
Partial discharges
Electric fields
Multilayer films
Film thickness
Ignition
Electric potential

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Behaviour of multilayer PET polymer film insulation in high electric fields. / Gefle, O. S.; Lebedev, S. M.; Pokholkov, Y. P.; Vitellas, I.; Agoris, D. P.

In: IEE Proceedings: Science, Measurement and Technology, Vol. 151, No. 4, 07.2004, p. 273-277.

Research output: Contribution to journalArticle

@article{1a1b62205a954f77936087b4516f1002,
title = "Behaviour of multilayer PET polymer film insulation in high electric fields",
abstract = "Experimental results of breakdown voltage, tanδ and the parameters of partial discharges for multilayer Polyfilm insulation are presented. It is shown that the breakdown voltage of multilayer film insulation may be increased approximately by 70{\%} compared with single-layer insulation of the same thickness due to the correct choice of the films' thickness. It is established that this increase in the breakdown voltage is associated with the increase of the ignition voltage of critical partial discharges.",
author = "Gefle, {O. S.} and Lebedev, {S. M.} and Pokholkov, {Y. P.} and I. Vitellas and Agoris, {D. P.}",
year = "2004",
month = "7",
doi = "10.1049/ip-smt:20040554",
language = "English",
volume = "151",
pages = "273--277",
journal = "IEE Proceedings: Science, Measurement and Technology",
issn = "1350-2344",
publisher = "Institute of Electrical Engineers",
number = "4",

}

TY - JOUR

T1 - Behaviour of multilayer PET polymer film insulation in high electric fields

AU - Gefle, O. S.

AU - Lebedev, S. M.

AU - Pokholkov, Y. P.

AU - Vitellas, I.

AU - Agoris, D. P.

PY - 2004/7

Y1 - 2004/7

N2 - Experimental results of breakdown voltage, tanδ and the parameters of partial discharges for multilayer Polyfilm insulation are presented. It is shown that the breakdown voltage of multilayer film insulation may be increased approximately by 70% compared with single-layer insulation of the same thickness due to the correct choice of the films' thickness. It is established that this increase in the breakdown voltage is associated with the increase of the ignition voltage of critical partial discharges.

AB - Experimental results of breakdown voltage, tanδ and the parameters of partial discharges for multilayer Polyfilm insulation are presented. It is shown that the breakdown voltage of multilayer film insulation may be increased approximately by 70% compared with single-layer insulation of the same thickness due to the correct choice of the films' thickness. It is established that this increase in the breakdown voltage is associated with the increase of the ignition voltage of critical partial discharges.

UR - http://www.scopus.com/inward/record.url?scp=3442885095&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=3442885095&partnerID=8YFLogxK

U2 - 10.1049/ip-smt:20040554

DO - 10.1049/ip-smt:20040554

M3 - Article

VL - 151

SP - 273

EP - 277

JO - IEE Proceedings: Science, Measurement and Technology

JF - IEE Proceedings: Science, Measurement and Technology

SN - 1350-2344

IS - 4

ER -