Barrier effect in dielectrics

Abstract

This paper presents results of the barrier effect study in gaseous and solid dielectrics in divergent and quasi-uniform electric fields. The influence of various factors such as the position of the barrier in gap, the permittivity and the conductivity change both on the breakdown voltage (V_b) and breakdown time (τ_b) in the uniform field and on the tree-initiation time (τ_i) in the divergent field was investigated. Application of barriers with high permittivity may result in a significant increase in τ_b. An analysis of existing models of the barrier effect is presented.

Original language	English
Title of host publication	Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
Place of Publication	Piscataway, NJ, United States
Publisher	IEEE
Pages	895-898
Number of pages	4
Volume	2
Publication status	Published - 2000
Event	6th Interantional Conference on Properties and Applications of Dielectric Materials - Xi'an, China Duration: 21 Jun 2000 → 26 Jun 2000

Other

Other	6th Interantional Conference on Properties and Applications of Dielectric Materials
City	Xi'an, China
Period	21.6.00 → 26.6.00

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Barrier effect in dielectrics'. Together they form a unique fingerprint.

Cite this

@inproceedings{3bf75073af7d43f493ef30683e345147,

title = "Barrier effect in dielectrics",

abstract = "This paper presents results of the barrier effect study in gaseous and solid dielectrics in divergent and quasi-uniform electric fields. The influence of various factors such as the position of the barrier in gap, the permittivity and the conductivity change both on the breakdown voltage (Vb) and breakdown time (τb) in the uniform field and on the tree-initiation time (τi) in the divergent field was investigated. Application of barriers with high permittivity may result in a significant increase in τb. An analysis of existing models of the barrier effect is presented.",

author = "Lebedev, {S. M.} and Gefle, {O. S.} and Agoris, {D. P.} and Pokholkov, {Yu P.}",

year = "2000",

language = "English",

volume = "2",

pages = "895--898",

booktitle = "Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials",

publisher = "IEEE",

note = "6th Interantional Conference on Properties and Applications of Dielectric Materials ; Conference date: 21-06-2000 Through 26-06-2000",

}

TY - GEN

T1 - Barrier effect in dielectrics

AU - Lebedev, S. M.

AU - Gefle, O. S.

AU - Agoris, D. P.

AU - Pokholkov, Yu P.

PY - 2000

Y1 - 2000

N2 - This paper presents results of the barrier effect study in gaseous and solid dielectrics in divergent and quasi-uniform electric fields. The influence of various factors such as the position of the barrier in gap, the permittivity and the conductivity change both on the breakdown voltage (Vb) and breakdown time (τb) in the uniform field and on the tree-initiation time (τi) in the divergent field was investigated. Application of barriers with high permittivity may result in a significant increase in τb. An analysis of existing models of the barrier effect is presented.

AB - This paper presents results of the barrier effect study in gaseous and solid dielectrics in divergent and quasi-uniform electric fields. The influence of various factors such as the position of the barrier in gap, the permittivity and the conductivity change both on the breakdown voltage (Vb) and breakdown time (τb) in the uniform field and on the tree-initiation time (τi) in the divergent field was investigated. Application of barriers with high permittivity may result in a significant increase in τb. An analysis of existing models of the barrier effect is presented.

UR - http://www.scopus.com/inward/record.url?scp=0034515537&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0034515537&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0034515537

VL - 2

SP - 895

EP - 898

BT - Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

PB - IEEE

CY - Piscataway, NJ, United States

T2 - 6th Interantional Conference on Properties and Applications of Dielectric Materials

Y2 - 21 June 2000 through 26 June 2000

ER -